Effect of photodiode angular response on surface plasmon resonance measurements in the Kretschmann-Raether configuration
We study the effect of photodiode angular response on the measurement of surface plasmon resonance (SPR) in metallic thin films using the Kretschmann-Raether configuration. The photodiode signal depends not only on the light intensity but also on the incidence angle. This mplies that the photodiode...
| Autores: | , , , , , , |
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| Tipo de documento: | artigo |
| Data de publicação: | 2012 |
| País: | España |
| Recursos: | Universidad Complutense de Madrid (UCM) |
| Repositório: | Docta Complutense |
| Idioma: | inglês |
| OAI Identifier: | oai:docta.ucm.es:20.500.14352/42671 |
| Acesso em linha: | https://hdl.handle.net/20.500.14352/42671 |
| Access Level: | Acceso aberto |
| Palavra-chave: | 538.9 Optical-Constants Films Metals Física de materiales Física del estado sólido 2211 Física del Estado Sólido |
| Resumo: | We study the effect of photodiode angular response on the measurement of surface plasmon resonance (SPR) in metallic thin films using the Kretschmann-Raether configuration. The photodiode signal depends not only on the light intensity but also on the incidence angle. This mplies that the photodiode sensitivity changes along the SPR curve. Consequently, the measured SPR spectrum is distorted, thus affecting fits and numerical analyses of SPR curves. We analyze the magnitude of this change, determine when it is significant, and develop a calibration method of the experimental setup which corrects for this type of spectral shape distortions. |
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