Cita APA

Marqués Cuesta, L. A., Aboy Cebrián, M., Dudeck, K. J., Botton, G. A., Knights, A. P., & Gwilliam, R. M. (2014). Modeling and experimental characterization of stepped and v-shaped {311} defects in silicon.

Citación estilo Chicago

Marqués Cuesta, Luis Alberto, María Aboy Cebrián, Karleen J. Dudeck, Gianluigi A. Botton, Andrew P. Knights, y Russell M. Gwilliam. Modeling and Experimental Characterization of Stepped and V-shaped {311} Defects in Silicon. 2014.

Cita MLA

Marqués Cuesta, Luis Alberto, et al. Modeling and Experimental Characterization of Stepped and V-shaped {311} Defects in Silicon. 2014.