Atomic species identification at the (101) anatase surface by simultaneous scanning tunnelling and atomic force microscopy
<div> Anatase is a pivotal material in devices for energy-harvesting applications and catalysis.</div> <div> Methods for the accurate characterization of this reducible oxide at the atomic scale are</div> <div> critical in the exploration of outstanding properties for t...
| Autores: | , , , , , , , , , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2015 |
| País: | España |
| Institución: | Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya) |
| Repositorio: | Recercat. Dipósit de la Recerca de Catalunya |
| OAI Identifier: | oai:recercat.cat:2072/305890 |
| Acceso en línea: | http://hdl.handle.net/2072/305890 https://doi.org/10.1038/ncomms8265 |
| Access Level: | acceso abierto |
| Sumario: | <div> Anatase is a pivotal material in devices for energy-harvesting applications and catalysis.</div> <div> Methods for the accurate characterization of this reducible oxide at the atomic scale are</div> <div> critical in the exploration of outstanding properties for technological developments. Here</div> <div> we combine atomic force microscopy (AFM) and scanning tunnelling microscopy (STM),</div> <div> supported by first-principles calculations, for the simultaneous imaging and unambiguous</div> <div> identification of atomic species at the (101) anatase surface. We demonstrate that dynamic</div> <div> AFM-STM operation allows atomic resolution imaging within the material’s band gap. Based</div> <div> on key distinguishing features extracted from calculations and experiments, we identify</div> <div> candidates for the most common surface defects. Our results pave the way for the understanding</div> <div> of surface processes, like adsorption of metal dopants and photoactive molecules,</div> <div> that are fundamental for the catalytic and photovoltaic applications of anatase, and</div> <div> demonstrate the potential of dynamic AFM-STM for the characterization of wide band gap</div> <div> materials.</div> |
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