Method of error analysis for phase-measuring algorithms applied to photoelasticity
We present a method of error analysis that can be applied for phase-measuring algorithms applied to photoelasticity. We calculate the contributions to the measurement error of the different elements of a circular polariscope as perturbations of the Jones matrices associated with each element. The Jo...
| Autores: | , |
|---|---|
| Tipo de recurso: | artículo |
| Fecha de publicación: | 1998 |
| País: | España |
| Institución: | Universidad Complutense de Madrid (UCM) |
| Repositorio: | Docta Complutense |
| Idioma: | inglés |
| OAI Identifier: | oai:docta.ucm.es:20.500.14352/58798 |
| Acceso en línea: | https://hdl.handle.net/20.500.14352/58798 |
| Access Level: | acceso abierto |
| Palabra clave: | 535 Interferometry Óptica (Física) 2209.19 Óptica Física |
| Sumario: | We present a method of error analysis that can be applied for phase-measuring algorithms applied to photoelasticity. We calculate the contributions to the measurement error of the different elements of a circular polariscope as perturbations of the Jones matrices associated with each element. The Jones matrix of the real polariscope can then be calculated as a sum of the nominal matrix and a series of contributions that depend on the errors associated with each element separately. We apply this method to the analysis of phase-measuring algorithms for the determination of isoclinics and isochromatics, including comparisons with real measurements. |
|---|