Registro de Citas

Cita APA

Porti, M., Goyal, R., Crespo-Yepes, A., Rodriguez, R., & Nafria, M. (2025). Replication Data for: A statistical characterization of dielectric breakdown in FDSOI nanowire transistors.

Citación estilo Chicago

Porti, Marc, Rishab Goyal, Albert Crespo-Yepes, Rosana Rodriguez, y Montserrat Nafria. Replication Data For: A Statistical Characterization of Dielectric Breakdown in FDSOI Nanowire Transistors. 2025.

Cita MLA

Porti, Marc, et al. Replication Data For: A Statistical Characterization of Dielectric Breakdown in FDSOI Nanowire Transistors. 2025.

Precaución: Estas citas no son 100% exactas.

Warning: fopen(/tmp/vufind_sessions/sess_dgheg3s3rh5i9stnpk494hcks4): failed to open stream: No space left on device in /usr/local/vufind/module/VuFind/src/VuFind/Session/File.php on line 153
Cannot write session to /tmp/vufind_sessions/sess_dgheg3s3rh5i9stnpk494hcks4
Warning: session_write_close(): Failed to write session data using user defined save handler. (session.save_path: /var/lib/php/session) in /usr/local/vufind/vendor/zendframework/zend-session/src/SessionManager.php on line 234