Electromagnetic Simulation of the Sub-THz Radiation Coupling to n-channel strained-silicon MODFETs

[EN]We report on a study of the coupling of electromagnetic radiation to a strained-silicon MODFETs used as sub-THz terahertz detector. In particular, the effect of the polarization of the incoming beam as well as the role of the bonding wires on the photoresponse generated were addressed. Two tones...

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Detalles Bibliográficos
Autores: Calvo Gallego, Jaime, Delgado Notario, Juan Antonio, Ferrando-Bataller, Miguel, Fobelets, Kristel, Meziani, Yahya Moubarak, Velázquez Pérez, Jesús Enrique
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2021
País:España
Institución:Universidad de Salamanca (USAL)
Repositorio:GREDOS. Repositorio Institucional de la Universidad de Salamanca
OAI Identifier:oai:gredos.usal.es:10366/160468
Acceso en línea:http://hdl.handle.net/10366/160468
Access Level:acceso embargado
Palabra clave:Electromagnetic simulation
Scientific computing
Terahertz (THz)
THz Radiation
Sub-THz Radiation Coupling
n-channel strained-silicon MODFETs
1203 Ciencia de los ordenadores
3325 Tecnología de las Telecomunicaciones
3307 Tecnología Electrónica
3304 Tecnología de Los Ordenadores
Descripción
Sumario:[EN]We report on a study of the coupling of electromagnetic radiation to a strained-silicon MODFETs used as sub-THz terahertz detector. In particular, the effect of the polarization of the incoming beam as well as the role of the bonding wires on the photoresponse generated were addressed. Two tones were considered: 0.15 and 0.30THz. Results show that the device is sensitive to the beam polarization, especially when the beam polarization is perpendicular to the transistor channel under excitation at 0.15THz. We also demonstrated that the bonding wires play a preponderant role in the coupling of the incoming radiation to the channel of the FET under excitation at 0.15THz while they have a minor role at higher frequencies (0.3THz).