Changes in the thermal stability of 2G HTS wires by local modification of the stabilization layer

In order to use 2G HTS wires in superconducting devices, it is important to understand the origin of thermal instabilities in these materials. Previous results showed that inhomogeneities in the critical current distribution are not the only factor that determines the heat generation distribution al...

Descripción completa

Detalles Bibliográficos
Autores: Angurel, Luis A., Martínez Fernández, Elena, Pelegrín, J., Lahoz, Ruth, Fuente, Germán F. de la, Andrés, Nieves, Arroyo, M. Pilar
Tipo de recurso: artículo
Fecha de publicación:2011
País:España
Institución:Consejo Superior de Investigaciones Científicas (CSIC)
Repositorio:DIGITAL.CSIC. Repositorio Institucional del CSIC
OAI Identifier:oai:digital.csic.es:10261/52425
Acceso en línea:http://hdl.handle.net/10261/52425
Access Level:acceso abierto
id ES_4e05e27281def4c71f5655ceb80b2fea
oai_identifier_str oai:digital.csic.es:10261/52425
network_acronym_str ES
network_name_str España
repository_id_str
spelling Changes in the thermal stability of 2G HTS wires by local modification of the stabilization layerAngurel, Luis A.Martínez Fernández, ElenaPelegrín, J.Lahoz, RuthFuente, Germán F. de laAndrés, NievesArroyo, M. PilarIn order to use 2G HTS wires in superconducting devices, it is important to understand the origin of thermal instabilities in these materials. Previous results showed that inhomogeneities in the critical current distribution are not the only factor that determines the heat generation distribution along the sample when the current exceeds the critical value. In this work, different types of controlled defects have been generated in the Cu-layer using laser ablation. In all cases, laser parameters have been chosen while assuring that the critical current of the superconductor does not deteriorate. It has been obtained that even if the thickness of the stabilizing layer is reduced from 20 μm to less than 10 μm in some regions, the sample response to overcurrents is not modified. © 2011 IEEE.This work was supported in part by the Spanish Ministry of Science and Innovation (Projects MAT2008-05983-C03-01 and -03, CEN2007-2014) and by the Gobierno de Aragón (T12, T74 and T63 research groups).Peer ReviewedInstitute of Electrical and Electronics Engineers2012201220112012info:eu-repo/semantics/articlehttp://purl.org/coar/resource_type/c_6501http://hdl.handle.net/10261/52425reponame:DIGITAL.CSIC. Repositorio Institucional del CSICinstname:Consejo Superior de Investigaciones Científicas (CSIC)Inglésinfo:eu-repo/semantics/openAccessoai:digital.csic.es:10261/524252026-05-22T06:33:51Z
dc.title.none.fl_str_mv Changes in the thermal stability of 2G HTS wires by local modification of the stabilization layer
title Changes in the thermal stability of 2G HTS wires by local modification of the stabilization layer
spellingShingle Changes in the thermal stability of 2G HTS wires by local modification of the stabilization layer
Angurel, Luis A.
title_short Changes in the thermal stability of 2G HTS wires by local modification of the stabilization layer
title_full Changes in the thermal stability of 2G HTS wires by local modification of the stabilization layer
title_fullStr Changes in the thermal stability of 2G HTS wires by local modification of the stabilization layer
title_full_unstemmed Changes in the thermal stability of 2G HTS wires by local modification of the stabilization layer
title_sort Changes in the thermal stability of 2G HTS wires by local modification of the stabilization layer
dc.creator.none.fl_str_mv Angurel, Luis A.
Martínez Fernández, Elena
Pelegrín, J.
Lahoz, Ruth
Fuente, Germán F. de la
Andrés, Nieves
Arroyo, M. Pilar
author Angurel, Luis A.
author_facet Angurel, Luis A.
Martínez Fernández, Elena
Pelegrín, J.
Lahoz, Ruth
Fuente, Germán F. de la
Andrés, Nieves
Arroyo, M. Pilar
author_role author
author2 Martínez Fernández, Elena
Pelegrín, J.
Lahoz, Ruth
Fuente, Germán F. de la
Andrés, Nieves
Arroyo, M. Pilar
author2_role author
author
author
author
author
author
description In order to use 2G HTS wires in superconducting devices, it is important to understand the origin of thermal instabilities in these materials. Previous results showed that inhomogeneities in the critical current distribution are not the only factor that determines the heat generation distribution along the sample when the current exceeds the critical value. In this work, different types of controlled defects have been generated in the Cu-layer using laser ablation. In all cases, laser parameters have been chosen while assuring that the critical current of the superconductor does not deteriorate. It has been obtained that even if the thickness of the stabilizing layer is reduced from 20 μm to less than 10 μm in some regions, the sample response to overcurrents is not modified. © 2011 IEEE.
publishDate 2011
dc.date.none.fl_str_mv 2011
2012
2012
2012
dc.type.none.fl_str_mv info:eu-repo/semantics/article
http://purl.org/coar/resource_type/c_6501
format article
dc.identifier.none.fl_str_mv http://hdl.handle.net/10261/52425
url http://hdl.handle.net/10261/52425
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.publisher.none.fl_str_mv Institute of Electrical and Electronics Engineers
publisher.none.fl_str_mv Institute of Electrical and Electronics Engineers
dc.source.none.fl_str_mv reponame:DIGITAL.CSIC. Repositorio Institucional del CSIC
instname:Consejo Superior de Investigaciones Científicas (CSIC)
instname_str Consejo Superior de Investigaciones Científicas (CSIC)
reponame_str DIGITAL.CSIC. Repositorio Institucional del CSIC
collection DIGITAL.CSIC. Repositorio Institucional del CSIC
repository.name.fl_str_mv
repository.mail.fl_str_mv
_version_ 1869407729695588352
score 15.811543

Similares en LA Referencia