APA Citation

Fiorelli, R., & Peralías Macías, E. (2016). Semi-empirical RF MOST model for CMOS 65 nm technologies: Theory, extraction method and validation.

Chicago Style Citation

Fiorelli, Rafaella, and Eduardo Peralías Macías. Semi-empirical RF MOST Model for CMOS 65 Nm Technologies: Theory, Extraction Method and Validation. 2016.

MLA Citation

Fiorelli, Rafaella, and Eduardo Peralías Macías. Semi-empirical RF MOST Model for CMOS 65 Nm Technologies: Theory, Extraction Method and Validation. 2016.

Warning: These citations may not always be 100% accurate.