Size effect on current fluctuations in thin metal films: Monte Carlo approach
Current fluctuations associated with the classical size effect, for which the mean free path of the carriers λ is comparable to, or greater than, the film thickness d, have been investigated. The Monte Carlo approach has been extended into the Knudsen regime of electron transport. Using this method,...
| Autores: | , , |
|---|---|
| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 1992 |
| País: | España |
| Institución: | Universidad de Barcelona |
| Repositorio: | Dipòsit Digital de la UB |
| OAI Identifier: | oai:diposit.ub.edu:2445/10915 |
| Acceso en línea: | https://hdl.handle.net/2445/10915 |
| Access Level: | acceso abierto |
| Palabra clave: | Pel·lícules metàl·liques Mètode de Montecarlo Metallic films Monte Carlo method |
| Sumario: | Current fluctuations associated with the classical size effect, for which the mean free path of the carriers λ is comparable to, or greater than, the film thickness d, have been investigated. The Monte Carlo approach has been extended into the Knudsen regime of electron transport. Using this method, the autocorrelation function and the spectral density of the fluctuations depending on two parameters (the ratio γ=λ/d and the surface specularity p) have been calculated. A procedure to generate the angle of diffuse electron scattering at the surface is described for both the Fuchs and the Soffer boundary conditions. It is demonstrated for both models that, with increasing γ and with decreasing p, the low-frequency noise is suppressed, with a redistribution toward higher frequencies. In such a case, the autocorrelation function is not exponential and the corresponding spectral density of the fluctuations is no longer Lorentzian. |
|---|