Visualized multiprobe electrical impedance measurements with STM tips using shear force feedback control

Here we devise a multiprobe electrical measurement system based on quartz tuning forks (QTFs) and metallic tips capable of having full 3D control over the position of the probes. The system is based on the use of bent tungsten tips that are placed in mechanical contact (glue-free solution) with a QT...

Descripción completa

Detalles Bibliográficos
Autores: Botaya Turón, Luis, Coromina, Xavier, Samitier i Martí, Josep, Puig i Vidal, Manuel, Otero Díaz, Jorge
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2016
País:España
Institución:Universidad de Barcelona
Repositorio:Dipòsit Digital de la UB
OAI Identifier:oai:diposit.ub.edu:2445/113042
Acceso en línea:https://hdl.handle.net/2445/113042
Access Level:acceso abierto
Palabra clave:Microscòpia d'efecte túnel
Impedància (Electricitat)
Quars
Scanning tunneling microscopy
Impedance (Electricity)
Quartz
id ES_46bd5e6ffbb778a5489d643dca87ea96
oai_identifier_str oai:diposit.ub.edu:2445/113042
network_acronym_str ES
network_name_str España
repository_id_str
spelling Visualized multiprobe electrical impedance measurements with STM tips using shear force feedback controlBotaya Turón, LuisCoromina, XavierSamitier i Martí, JosepPuig i Vidal, ManuelOtero Díaz, JorgeMicroscòpia d'efecte túnelImpedància (Electricitat)QuarsScanning tunneling microscopyImpedance (Electricity)QuartzHere we devise a multiprobe electrical measurement system based on quartz tuning forks (QTFs) and metallic tips capable of having full 3D control over the position of the probes. The system is based on the use of bent tungsten tips that are placed in mechanical contact (glue-free solution) with a QTF sensor. Shear forces acting in the probe are measured to control the tip-sample distance in the Z direction. Moreover, the tilting of the tip allows the visualization of the experiment under the optical microscope, allowing the coordination of the probes in X and Y directions. Meanwhile, the metallic tips are connected to a current-voltage amplifier circuit to measure the currents and thus the impedance of the studied samples. We discuss here the different aspects that must be addressedwhenconductingthesemultiprobeexperiments,suchastheamplitudeofoscillation,shear force distance control, and wire tilting. Different results obtained in the measurement of calibration samples and microparticles are presented. They demonstrate the feasibility of the system to measure the impedance of the samples with a full 3D control on the position of the nanotips.MDPI2016info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionapplication/pdfhttps://hdl.handle.net/2445/113042Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)reponame:Dipòsit Digital de la UBinstname:Universidad de BarcelonaInglésReproducció del document publicat a: https://doi.org/10.3390/s16060757Sensors, 2016, vol. 16, num. 6, p. 757https://doi.org/10.3390/s16060757cc-by (c) Botaya Turón, Luis et al., 2016http://creativecommons.org/licenses/by/3.0/esinfo:eu-repo/semantics/openAccessoai:diposit.ub.edu:2445/1130422026-05-27T06:46:51Z
dc.title.none.fl_str_mv Visualized multiprobe electrical impedance measurements with STM tips using shear force feedback control
title Visualized multiprobe electrical impedance measurements with STM tips using shear force feedback control
spellingShingle Visualized multiprobe electrical impedance measurements with STM tips using shear force feedback control
Botaya Turón, Luis
Microscòpia d'efecte túnel
Impedància (Electricitat)
Quars
Scanning tunneling microscopy
Impedance (Electricity)
Quartz
title_short Visualized multiprobe electrical impedance measurements with STM tips using shear force feedback control
title_full Visualized multiprobe electrical impedance measurements with STM tips using shear force feedback control
title_fullStr Visualized multiprobe electrical impedance measurements with STM tips using shear force feedback control
title_full_unstemmed Visualized multiprobe electrical impedance measurements with STM tips using shear force feedback control
title_sort Visualized multiprobe electrical impedance measurements with STM tips using shear force feedback control
dc.creator.none.fl_str_mv Botaya Turón, Luis
Coromina, Xavier
Samitier i Martí, Josep
Puig i Vidal, Manuel
Otero Díaz, Jorge
author Botaya Turón, Luis
author_facet Botaya Turón, Luis
Coromina, Xavier
Samitier i Martí, Josep
Puig i Vidal, Manuel
Otero Díaz, Jorge
author_role author
author2 Coromina, Xavier
Samitier i Martí, Josep
Puig i Vidal, Manuel
Otero Díaz, Jorge
author2_role author
author
author
author
dc.subject.none.fl_str_mv Microscòpia d'efecte túnel
Impedància (Electricitat)
Quars
Scanning tunneling microscopy
Impedance (Electricity)
Quartz
topic Microscòpia d'efecte túnel
Impedància (Electricitat)
Quars
Scanning tunneling microscopy
Impedance (Electricity)
Quartz
description Here we devise a multiprobe electrical measurement system based on quartz tuning forks (QTFs) and metallic tips capable of having full 3D control over the position of the probes. The system is based on the use of bent tungsten tips that are placed in mechanical contact (glue-free solution) with a QTF sensor. Shear forces acting in the probe are measured to control the tip-sample distance in the Z direction. Moreover, the tilting of the tip allows the visualization of the experiment under the optical microscope, allowing the coordination of the probes in X and Y directions. Meanwhile, the metallic tips are connected to a current-voltage amplifier circuit to measure the currents and thus the impedance of the studied samples. We discuss here the different aspects that must be addressedwhenconductingthesemultiprobeexperiments,suchastheamplitudeofoscillation,shear force distance control, and wire tilting. Different results obtained in the measurement of calibration samples and microparticles are presented. They demonstrate the feasibility of the system to measure the impedance of the samples with a full 3D control on the position of the nanotips.
publishDate 2016
dc.date.none.fl_str_mv 2016
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
format article
status_str publishedVersion
dc.identifier.none.fl_str_mv https://hdl.handle.net/2445/113042
url https://hdl.handle.net/2445/113042
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv Reproducció del document publicat a: https://doi.org/10.3390/s16060757
Sensors, 2016, vol. 16, num. 6, p. 757
https://doi.org/10.3390/s16060757
dc.rights.none.fl_str_mv cc-by (c) Botaya Turón, Luis et al., 2016
http://creativecommons.org/licenses/by/3.0/es
info:eu-repo/semantics/openAccess
rights_invalid_str_mv cc-by (c) Botaya Turón, Luis et al., 2016
http://creativecommons.org/licenses/by/3.0/es
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv MDPI
publisher.none.fl_str_mv MDPI
dc.source.none.fl_str_mv Articles publicats en revistes (Enginyeria Electrònica i Biomèdica)
reponame:Dipòsit Digital de la UB
instname:Universidad de Barcelona
instname_str Universidad de Barcelona
reponame_str Dipòsit Digital de la UB
collection Dipòsit Digital de la UB
repository.name.fl_str_mv
repository.mail.fl_str_mv
_version_ 1869407247854993408
score 15.300724

Similares en LA Referencia