Characterization Technique to Reveal Critical Resonances in Non-linear RF Circuits
The presence of critical resonances can significantly impact the stable and robust operation of microwave amplifiers, leading to spurious oscillations in the worst case. In this work, a technique based on noise measurements performed with a spectrum analyzer is presented to experimentally characteri...
| Authors: | , , , |
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| Format: | article |
| Publication Date: | 2022 |
| Country: | España |
| Institution: | Universidad del País Vasco |
| Repository: | Addi. Archivo Digital para la Docencia y la Investigación |
| OAI Identifier: | oai:addi.ehu.eus:10810/71058 |
| Online Access: | http://hdl.handle.net/10810/71058 |
| Access Level: | Open access |
| Keyword: | circuit stability noisy precursor poles and zeros resonances stability margin |
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Characterization Technique to Reveal Critical Resonances in Non-linear RF CircuitsOtegi Urdanpilleta, NereaCollantes Metola, Juan MaríaLizarraga Mallo, IboneGonzález Pérez, José Manuelcircuit stabilitynoisy precursorpoles and zerosresonancesstability marginThe presence of critical resonances can significantly impact the stable and robust operation of microwave amplifiers, leading to spurious oscillations in the worst case. In this work, a technique based on noise measurements performed with a spectrum analyzer is presented to experimentally characterize these resonances. Broadband white noise is injected into the input of the circuit, so the critical resonances are clearly revealed above the noise floor of the measuring instrument, without the need of exigent settings and far from the bifurcation point. In addition to detecting potentially risky resonances, the actual position of the critical poles on the pole-zero map can be estimated from these noise measurements by applying pole-zero identification techniques. The noise injection technique has been tested in two nonlinear prototypes in microstrip technology: an analog frequency divider and an L -band amplifier.This work was supported by the Spanish Administration under Project PID2019-104820RB-I00.IEEE202420242022info:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/10810/71058reponame:Addi. Archivo Digital para la Docencia y la Investigacióninstname:Universidad del País VascoIngléshttps://doi.org/10.1109/TIM.2022.3170883info:eu-repo/semantics/openAccess© 2022 IEEEoai:addi.ehu.eus:10810/710582026-06-18T09:23:17Z |
| dc.title.none.fl_str_mv |
Characterization Technique to Reveal Critical Resonances in Non-linear RF Circuits |
| title |
Characterization Technique to Reveal Critical Resonances in Non-linear RF Circuits |
| spellingShingle |
Characterization Technique to Reveal Critical Resonances in Non-linear RF Circuits Otegi Urdanpilleta, Nerea circuit stability noisy precursor poles and zeros resonances stability margin |
| title_short |
Characterization Technique to Reveal Critical Resonances in Non-linear RF Circuits |
| title_full |
Characterization Technique to Reveal Critical Resonances in Non-linear RF Circuits |
| title_fullStr |
Characterization Technique to Reveal Critical Resonances in Non-linear RF Circuits |
| title_full_unstemmed |
Characterization Technique to Reveal Critical Resonances in Non-linear RF Circuits |
| title_sort |
Characterization Technique to Reveal Critical Resonances in Non-linear RF Circuits |
| dc.creator.none.fl_str_mv |
Otegi Urdanpilleta, Nerea Collantes Metola, Juan María Lizarraga Mallo, Ibone González Pérez, José Manuel |
| author |
Otegi Urdanpilleta, Nerea |
| author_facet |
Otegi Urdanpilleta, Nerea Collantes Metola, Juan María Lizarraga Mallo, Ibone González Pérez, José Manuel |
| author_role |
author |
| author2 |
Collantes Metola, Juan María Lizarraga Mallo, Ibone González Pérez, José Manuel |
| author2_role |
author author author |
| dc.subject.none.fl_str_mv |
circuit stability noisy precursor poles and zeros resonances stability margin |
| topic |
circuit stability noisy precursor poles and zeros resonances stability margin |
| description |
The presence of critical resonances can significantly impact the stable and robust operation of microwave amplifiers, leading to spurious oscillations in the worst case. In this work, a technique based on noise measurements performed with a spectrum analyzer is presented to experimentally characterize these resonances. Broadband white noise is injected into the input of the circuit, so the critical resonances are clearly revealed above the noise floor of the measuring instrument, without the need of exigent settings and far from the bifurcation point. In addition to detecting potentially risky resonances, the actual position of the critical poles on the pole-zero map can be estimated from these noise measurements by applying pole-zero identification techniques. The noise injection technique has been tested in two nonlinear prototypes in microstrip technology: an analog frequency divider and an L -band amplifier. |
| publishDate |
2022 |
| dc.date.none.fl_str_mv |
2022 2024 2024 |
| dc.type.none.fl_str_mv |
info:eu-repo/semantics/article |
| format |
article |
| dc.identifier.none.fl_str_mv |
http://hdl.handle.net/10810/71058 |
| url |
http://hdl.handle.net/10810/71058 |
| dc.language.none.fl_str_mv |
Inglés |
| language_invalid_str_mv |
Inglés |
| dc.relation.none.fl_str_mv |
https://doi.org/10.1109/TIM.2022.3170883 |
| dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess © 2022 IEEE |
| eu_rights_str_mv |
openAccess |
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© 2022 IEEE |
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application/pdf |
| dc.publisher.none.fl_str_mv |
IEEE |
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IEEE |
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reponame:Addi. Archivo Digital para la Docencia y la Investigación instname:Universidad del País Vasco |
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Universidad del País Vasco |
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Addi. Archivo Digital para la Docencia y la Investigación |
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Addi. Archivo Digital para la Docencia y la Investigación |
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