Characterization Technique to Reveal Critical Resonances in Non-linear RF Circuits

The presence of critical resonances can significantly impact the stable and robust operation of microwave amplifiers, leading to spurious oscillations in the worst case. In this work, a technique based on noise measurements performed with a spectrum analyzer is presented to experimentally characteri...

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Authors: Otegi Urdanpilleta, Nerea, Collantes Metola, Juan María, Lizarraga Mallo, Ibone, González Pérez, José Manuel
Format: article
Publication Date:2022
Country:España
Institution:Universidad del País Vasco
Repository:Addi. Archivo Digital para la Docencia y la Investigación
OAI Identifier:oai:addi.ehu.eus:10810/71058
Online Access:http://hdl.handle.net/10810/71058
Access Level:Open access
Keyword:circuit stability
noisy precursor
poles and zeros
resonances
stability margin
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spelling Characterization Technique to Reveal Critical Resonances in Non-linear RF CircuitsOtegi Urdanpilleta, NereaCollantes Metola, Juan MaríaLizarraga Mallo, IboneGonzález Pérez, José Manuelcircuit stabilitynoisy precursorpoles and zerosresonancesstability marginThe presence of critical resonances can significantly impact the stable and robust operation of microwave amplifiers, leading to spurious oscillations in the worst case. In this work, a technique based on noise measurements performed with a spectrum analyzer is presented to experimentally characterize these resonances. Broadband white noise is injected into the input of the circuit, so the critical resonances are clearly revealed above the noise floor of the measuring instrument, without the need of exigent settings and far from the bifurcation point. In addition to detecting potentially risky resonances, the actual position of the critical poles on the pole-zero map can be estimated from these noise measurements by applying pole-zero identification techniques. The noise injection technique has been tested in two nonlinear prototypes in microstrip technology: an analog frequency divider and an L -band amplifier.This work was supported by the Spanish Administration under Project PID2019-104820RB-I00.IEEE202420242022info:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/10810/71058reponame:Addi. Archivo Digital para la Docencia y la Investigacióninstname:Universidad del País VascoIngléshttps://doi.org/10.1109/TIM.2022.3170883info:eu-repo/semantics/openAccess© 2022 IEEEoai:addi.ehu.eus:10810/710582026-06-18T09:23:17Z
dc.title.none.fl_str_mv Characterization Technique to Reveal Critical Resonances in Non-linear RF Circuits
title Characterization Technique to Reveal Critical Resonances in Non-linear RF Circuits
spellingShingle Characterization Technique to Reveal Critical Resonances in Non-linear RF Circuits
Otegi Urdanpilleta, Nerea
circuit stability
noisy precursor
poles and zeros
resonances
stability margin
title_short Characterization Technique to Reveal Critical Resonances in Non-linear RF Circuits
title_full Characterization Technique to Reveal Critical Resonances in Non-linear RF Circuits
title_fullStr Characterization Technique to Reveal Critical Resonances in Non-linear RF Circuits
title_full_unstemmed Characterization Technique to Reveal Critical Resonances in Non-linear RF Circuits
title_sort Characterization Technique to Reveal Critical Resonances in Non-linear RF Circuits
dc.creator.none.fl_str_mv Otegi Urdanpilleta, Nerea
Collantes Metola, Juan María
Lizarraga Mallo, Ibone
González Pérez, José Manuel
author Otegi Urdanpilleta, Nerea
author_facet Otegi Urdanpilleta, Nerea
Collantes Metola, Juan María
Lizarraga Mallo, Ibone
González Pérez, José Manuel
author_role author
author2 Collantes Metola, Juan María
Lizarraga Mallo, Ibone
González Pérez, José Manuel
author2_role author
author
author
dc.subject.none.fl_str_mv circuit stability
noisy precursor
poles and zeros
resonances
stability margin
topic circuit stability
noisy precursor
poles and zeros
resonances
stability margin
description The presence of critical resonances can significantly impact the stable and robust operation of microwave amplifiers, leading to spurious oscillations in the worst case. In this work, a technique based on noise measurements performed with a spectrum analyzer is presented to experimentally characterize these resonances. Broadband white noise is injected into the input of the circuit, so the critical resonances are clearly revealed above the noise floor of the measuring instrument, without the need of exigent settings and far from the bifurcation point. In addition to detecting potentially risky resonances, the actual position of the critical poles on the pole-zero map can be estimated from these noise measurements by applying pole-zero identification techniques. The noise injection technique has been tested in two nonlinear prototypes in microstrip technology: an analog frequency divider and an L -band amplifier.
publishDate 2022
dc.date.none.fl_str_mv 2022
2024
2024
dc.type.none.fl_str_mv info:eu-repo/semantics/article
format article
dc.identifier.none.fl_str_mv http://hdl.handle.net/10810/71058
url http://hdl.handle.net/10810/71058
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv https://doi.org/10.1109/TIM.2022.3170883
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
© 2022 IEEE
eu_rights_str_mv openAccess
rights_invalid_str_mv © 2022 IEEE
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv IEEE
publisher.none.fl_str_mv IEEE
dc.source.none.fl_str_mv reponame:Addi. Archivo Digital para la Docencia y la Investigación
instname:Universidad del País Vasco
instname_str Universidad del País Vasco
reponame_str Addi. Archivo Digital para la Docencia y la Investigación
collection Addi. Archivo Digital para la Docencia y la Investigación
repository.name.fl_str_mv
repository.mail.fl_str_mv
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