| Sumario: | Understanding and controlling macroscopic quantities directly associated with a random field, such as the coercive field Hc and dislocations in magnetic materials, is important for many applications that include films with perpendicular magnetic anisotropy. Here, using a model system with perpendicular magnetic anisotropy, Cu/Ni/Cu, we show that Hc in double 4 nm thick Ni films is about 0.65 times the value obtained for the single Ni film, a fact that can be understood if the propagation of misfit dislocations is not transmitted to the second magnetic block, implying that its statistical distribution remains unchanged whereas the magnetic driving force increases with the nickel thickness. This interpretation is based on the direct measurement of the in-plane and out-of-plane lattice parameters of the Ni blocks by the extended x-ray absorption fine structure method, a chemically selective technique tuned to probe exclusively the environment of the Ni atoms. With this finding and applying the rigid domain walls model, the Hc ratio between double and single Ni films is calculated, yielding a value of 0.71.
|
|---|
