Accurate Wide-Modulus-Range Nanomechanical Mapping of Ultrathin Interfaces with Bimodal Atomic Force Microscopy

[EN] The nanoscale determination of the mechanical properties of interfaces is of paramount relevance in materials science and cell biology. Bimodal atomic force microscopy (AFM) is arguably the most advanced nanoscale method for mapping the elastic modulus of interfaces. Simulations, theory, and ex...

Full description

Bibliographic Details
Authors: Gisbert, Victor G., García García, Ricardo
Format: article
Status:Versión aceptada para publicación
Publication Date:2021
Country:España
Institution:Consejo Superior de Investigaciones Científicas (CSIC)
Repository:DIGITAL.CSIC. Repositorio Institucional del CSIC
OAI Identifier:oai:digital.csic.es:10261/255640
Online Access:http://hdl.handle.net/10261/255640
Access Level:Open access
Keyword:Nanomechanics
Bimodal AFM
Elastic modulus
Ultrathin layers
Lipid bilayers
id ES_375832dc5dbaafa4f6b7dcfb695381bb
oai_identifier_str oai:digital.csic.es:10261/255640
network_acronym_str ES
network_name_str España
repository_id_str
spelling Accurate Wide-Modulus-Range Nanomechanical Mapping of Ultrathin Interfaces with Bimodal Atomic Force MicroscopyGisbert, Victor G.García García, RicardoNanomechanicsBimodal AFMElastic modulusUltrathin layersLipid bilayers[EN] The nanoscale determination of the mechanical properties of interfaces is of paramount relevance in materials science and cell biology. Bimodal atomic force microscopy (AFM) is arguably the most advanced nanoscale method for mapping the elastic modulus of interfaces. Simulations, theory, and experiments have validated bimodal AFM measurements on thick samples (from micrometer to millimeter). However, the bottom-effect artifact, this is, the influence of the rigid support on the determination of the Young’s modulus, questions its accuracy for ultrathin materials and interfaces (1–15 nm). Here we develop a bottom-effect correction method that yields the intrinsic Young’s modulus value of a material independent of its thickness. Experiments and numerical simulations validate the accuracy of the method for a wide range of materials (1 MPa to 100 GPa). Otherwise, the Young’s modulus of an ultrathin material might be overestimated by a 10-fold factor.Financial support from the Ministerio de Ciencia e Innovación (PID2019-106801GB-I00), CSIC 202050E013, and Comunidad de Madrid S2018/NMT-4443 (Tec4Bio-CM) is acknowledged.Peer reviewedAmerican Chemical SocietyMinisterio de Ciencia e Innovación (España)Consejo Superior de Investigaciones Científicas (España)Comunidad de MadridGisbert, Victor G. [0000-0002-9164-0411]García García, Ricardo [0000-0002-7115-1928]Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]202120212021info:eu-repo/semantics/articlehttp://purl.org/coar/resource_type/c_6501Postprintinfo:eu-repo/semantics/acceptedVersionhttp://hdl.handle.net/10261/255640reponame:DIGITAL.CSIC. Repositorio Institucional del CSICinstname:Consejo Superior de Investigaciones Científicas (CSIC)Inglés#PLACEHOLDER_PARENT_METADATA_VALUE##PLACEHOLDER_PARENT_METADATA_VALUE#info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-106801GB-I00S2018/NMT-4443/Tec4Bio-CMhttps://doi.org/10.1021/acsnano.1c09178Síinfo:eu-repo/semantics/openAccessoai:digital.csic.es:10261/2556402026-05-22T06:33:51Z
dc.title.none.fl_str_mv Accurate Wide-Modulus-Range Nanomechanical Mapping of Ultrathin Interfaces with Bimodal Atomic Force Microscopy
title Accurate Wide-Modulus-Range Nanomechanical Mapping of Ultrathin Interfaces with Bimodal Atomic Force Microscopy
spellingShingle Accurate Wide-Modulus-Range Nanomechanical Mapping of Ultrathin Interfaces with Bimodal Atomic Force Microscopy
Gisbert, Victor G.
Nanomechanics
Bimodal AFM
Elastic modulus
Ultrathin layers
Lipid bilayers
title_short Accurate Wide-Modulus-Range Nanomechanical Mapping of Ultrathin Interfaces with Bimodal Atomic Force Microscopy
title_full Accurate Wide-Modulus-Range Nanomechanical Mapping of Ultrathin Interfaces with Bimodal Atomic Force Microscopy
title_fullStr Accurate Wide-Modulus-Range Nanomechanical Mapping of Ultrathin Interfaces with Bimodal Atomic Force Microscopy
title_full_unstemmed Accurate Wide-Modulus-Range Nanomechanical Mapping of Ultrathin Interfaces with Bimodal Atomic Force Microscopy
title_sort Accurate Wide-Modulus-Range Nanomechanical Mapping of Ultrathin Interfaces with Bimodal Atomic Force Microscopy
dc.creator.none.fl_str_mv Gisbert, Victor G.
García García, Ricardo
author Gisbert, Victor G.
author_facet Gisbert, Victor G.
García García, Ricardo
author_role author
author2 García García, Ricardo
author2_role author
dc.contributor.none.fl_str_mv Ministerio de Ciencia e Innovación (España)
Consejo Superior de Investigaciones Científicas (España)
Comunidad de Madrid
Gisbert, Victor G. [0000-0002-9164-0411]
García García, Ricardo [0000-0002-7115-1928]
Consejo Superior de Investigaciones Científicas [https://ror.org/02gfc7t72]
dc.subject.none.fl_str_mv Nanomechanics
Bimodal AFM
Elastic modulus
Ultrathin layers
Lipid bilayers
topic Nanomechanics
Bimodal AFM
Elastic modulus
Ultrathin layers
Lipid bilayers
description [EN] The nanoscale determination of the mechanical properties of interfaces is of paramount relevance in materials science and cell biology. Bimodal atomic force microscopy (AFM) is arguably the most advanced nanoscale method for mapping the elastic modulus of interfaces. Simulations, theory, and experiments have validated bimodal AFM measurements on thick samples (from micrometer to millimeter). However, the bottom-effect artifact, this is, the influence of the rigid support on the determination of the Young’s modulus, questions its accuracy for ultrathin materials and interfaces (1–15 nm). Here we develop a bottom-effect correction method that yields the intrinsic Young’s modulus value of a material independent of its thickness. Experiments and numerical simulations validate the accuracy of the method for a wide range of materials (1 MPa to 100 GPa). Otherwise, the Young’s modulus of an ultrathin material might be overestimated by a 10-fold factor.
publishDate 2021
dc.date.none.fl_str_mv 2021
2021
2021
dc.type.none.fl_str_mv info:eu-repo/semantics/article
http://purl.org/coar/resource_type/c_6501
Postprint
info:eu-repo/semantics/acceptedVersion
format article
status_str acceptedVersion
dc.identifier.none.fl_str_mv http://hdl.handle.net/10261/255640
url http://hdl.handle.net/10261/255640
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv #PLACEHOLDER_PARENT_METADATA_VALUE#
#PLACEHOLDER_PARENT_METADATA_VALUE#
info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/PID2019-106801GB-I00
S2018/NMT-4443/Tec4Bio-CM
https://doi.org/10.1021/acsnano.1c09178
Sí
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.publisher.none.fl_str_mv American Chemical Society
publisher.none.fl_str_mv American Chemical Society
dc.source.none.fl_str_mv reponame:DIGITAL.CSIC. Repositorio Institucional del CSIC
instname:Consejo Superior de Investigaciones Científicas (CSIC)
instname_str Consejo Superior de Investigaciones Científicas (CSIC)
reponame_str DIGITAL.CSIC. Repositorio Institucional del CSIC
collection DIGITAL.CSIC. Repositorio Institucional del CSIC
repository.name.fl_str_mv
repository.mail.fl_str_mv
_version_ 1869406031356887040
score 15,811543

Similar Items