Bottom Effect in Atomic Force Microscopy Nanomechanics

In this work, the influence of the rigid substrate on the determination of the sample Young''s modulus, the so-called bottom-effect artifact, is demonstrated by an atomic force microscopy force-spectroscopy experiment. The nanomechanical properties of a one-component supported lipid membra...

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Autores: Chiodini, Stefano, Ruiz-Rincón, Silvia, Garcia, P.D., Martin, Santiago, Kettelhoit, K., Armenia, I., Werz, D.B., Cea, Pilar
Tipo de recurso: artículo
Estado:Versión aceptada para publicación
Fecha de publicación:2020
País:España
Institución:Universidad de Zaragoza
Repositorio:Zaguán. Repositorio Digital de la Universidad de Zaragoza
OAI Identifier:oai:zaguan.unizar.es:106627
Acceso en línea:http://zaguan.unizar.es/record/106627
Access Level:acceso abierto
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spelling Bottom Effect in Atomic Force Microscopy NanomechanicsChiodini, StefanoRuiz-Rincón, SilviaGarcia, P.D.Martin, SantiagoKettelhoit, K.Armenia, I.Werz, D.B.Cea, PilarIn this work, the influence of the rigid substrate on the determination of the sample Young''s modulus, the so-called bottom-effect artifact, is demonstrated by an atomic force microscopy force-spectroscopy experiment. The nanomechanical properties of a one-component supported lipid membrane (SLM) exhibiting areas of two different thicknesses are studied: While a standard contact mechanics model (Sneddon) provides two different elastic moduli for these two morphologies, it is shown that Garcia''s bottom-effect artifact correction yields a unique value, as expected for an intrinsic material property. Remarkably, it is demonstrated that the ratio between the contact radius (and not only the indentation) and the sample thickness is the key parameter addressing the relevance of the bottom-effect artifact. The experimental results are validated by finite element method simulations providing a solid support to Garcia''s theory. The amphiphilic nature of the investigated material is representative of several kinds of lipids, suggesting that the results have far reaching implications for determining the correct Young''s modulus of SLMs. The generality of Garcia''s bottom-effect artifact correction allows its application to every kind of supported soft film.2020info:eu-repo/semantics/articleinfo:eu-repo/semantics/acceptedVersionapplication/pdfhttp://zaguan.unizar.es/record/106627reponame:Zaguán. Repositorio Digital de la Universidad de Zaragozainstname:Universidad de ZaragozaInglésinfo:eu-repo/grantAgreement/ES/DGA-FEDER/E31-17Rinfo:eu-repo/grantAgreement/EUR/ERA-NET-COFUND/MagicCellGene Project 2016info:eu-repo/grantAgreement/ES/MINECO/PCIN-2017-127info:eu-repo/semantics/openAccessoai:zaguan.unizar.es:1066272026-05-29T13:59:51Z
dc.title.none.fl_str_mv Bottom Effect in Atomic Force Microscopy Nanomechanics
title Bottom Effect in Atomic Force Microscopy Nanomechanics
spellingShingle Bottom Effect in Atomic Force Microscopy Nanomechanics
Chiodini, Stefano
title_short Bottom Effect in Atomic Force Microscopy Nanomechanics
title_full Bottom Effect in Atomic Force Microscopy Nanomechanics
title_fullStr Bottom Effect in Atomic Force Microscopy Nanomechanics
title_full_unstemmed Bottom Effect in Atomic Force Microscopy Nanomechanics
title_sort Bottom Effect in Atomic Force Microscopy Nanomechanics
dc.creator.none.fl_str_mv Chiodini, Stefano
Ruiz-Rincón, Silvia
Garcia, P.D.
Martin, Santiago
Kettelhoit, K.
Armenia, I.
Werz, D.B.
Cea, Pilar
author Chiodini, Stefano
author_facet Chiodini, Stefano
Ruiz-Rincón, Silvia
Garcia, P.D.
Martin, Santiago
Kettelhoit, K.
Armenia, I.
Werz, D.B.
Cea, Pilar
author_role author
author2 Ruiz-Rincón, Silvia
Garcia, P.D.
Martin, Santiago
Kettelhoit, K.
Armenia, I.
Werz, D.B.
Cea, Pilar
author2_role author
author
author
author
author
author
author
description In this work, the influence of the rigid substrate on the determination of the sample Young''s modulus, the so-called bottom-effect artifact, is demonstrated by an atomic force microscopy force-spectroscopy experiment. The nanomechanical properties of a one-component supported lipid membrane (SLM) exhibiting areas of two different thicknesses are studied: While a standard contact mechanics model (Sneddon) provides two different elastic moduli for these two morphologies, it is shown that Garcia''s bottom-effect artifact correction yields a unique value, as expected for an intrinsic material property. Remarkably, it is demonstrated that the ratio between the contact radius (and not only the indentation) and the sample thickness is the key parameter addressing the relevance of the bottom-effect artifact. The experimental results are validated by finite element method simulations providing a solid support to Garcia''s theory. The amphiphilic nature of the investigated material is representative of several kinds of lipids, suggesting that the results have far reaching implications for determining the correct Young''s modulus of SLMs. The generality of Garcia''s bottom-effect artifact correction allows its application to every kind of supported soft film.
publishDate 2020
dc.date.none.fl_str_mv 2020
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/acceptedVersion
format article
status_str acceptedVersion
dc.identifier.none.fl_str_mv http://zaguan.unizar.es/record/106627
url http://zaguan.unizar.es/record/106627
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv info:eu-repo/grantAgreement/ES/DGA-FEDER/E31-17R
info:eu-repo/grantAgreement/EUR/ERA-NET-COFUND/MagicCellGene Project 2016
info:eu-repo/grantAgreement/ES/MINECO/PCIN-2017-127
dc.rights.none.fl_str_mv info:eu-repo/semantics/openAccess
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv
publisher.none.fl_str_mv
dc.source.none.fl_str_mv reponame:Zaguán. Repositorio Digital de la Universidad de Zaragoza
instname:Universidad de Zaragoza
instname_str Universidad de Zaragoza
reponame_str Zaguán. Repositorio Digital de la Universidad de Zaragoza
collection Zaguán. Repositorio Digital de la Universidad de Zaragoza
repository.name.fl_str_mv
repository.mail.fl_str_mv
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score 15,301603

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