Cita APA

Ruiz Flores, A., Seoane, N., Claramunt, S., Garcia-Loureiro, A., Porti i Pujal, M., Couso, C., . . . Nafria, M. (2019). Workfunction fluctuations in polycrystalline TiN observed with KPFM and their impact on MOSFETs variability.

Citación estilo Chicago

Ruiz Flores, Ana|||0000-0002-2475-7353, Natalia|||0000-0003-0973-461X Seoane, Sergi|||0000-0002-2888-7825 Claramunt, Antonio|||0000-0003-0574-1513 Garcia-Loureiro, Marc|||0000-0001-7438-3823 Porti i Pujal, Carlos|||0000-0003-4757-2439 Couso, Javier|||0000-0001-5938-5898 Martin Martinez, y Montserrat|||0000-0002-9549-2890 Nafria. Workfunction Fluctuations in Polycrystalline TiN Observed With KPFM and Their Impact On MOSFETs Variability. 2019.

Cita MLA

Ruiz Flores, Ana|||0000-0002-2475-7353, et al. Workfunction Fluctuations in Polycrystalline TiN Observed With KPFM and Their Impact On MOSFETs Variability. 2019.