Catastrophic optical damage of high power InGaAs/AlGaAs laser diodes
Producción Científica
| Autores: | , , , , , |
|---|---|
| Tipo de recurso: | artículo |
| Fecha de publicación: | 2016 |
| País: | España |
| Institución: | Universidad de Valladolid |
| Repositorio: | UVaDOC. Repositorio Documental de la Universidad de Valladolid |
| OAI Identifier: | oai:uvadoc.uva.es:10324/21770 |
| Acceso en línea: | https://doi.org/10.1016/j.microrel.2016.07.038 http://uvadoc.uva.es/handle/10324/21770 |
| Access Level: | acceso abierto |
| Palabra clave: | Cathodoluminescence |
| id |
ES_2bea9b333f8d075ff75151abffb61c4a |
|---|---|
| oai_identifier_str |
oai:uvadoc.uva.es:10324/21770 |
| network_acronym_str |
ES |
| network_name_str |
España |
| repository_id_str |
|
| spelling |
Catastrophic optical damage of high power InGaAs/AlGaAs laser diodesSouto Bartolomé, Jorge ManuelPura Ruiz, José LuisTorres, AlfredoJiménez López, Juan IgnacioBettiati, MauroLaruelle, FrancoisCathodoluminescenceProducción CientíficaThe defects generated by the catastrophic optical degradation (COD) of high power laser diodes have been examined using cathodoluminescence (CL). Discontinuous dark lines that correspond to different levels of damage have been observed along the ridge. Finite element methods have been applied to solve a physical model for the degradation of the diodes that explicitly considers the thermal and mechanical properties of the laser structure. According to this model, the COD is triggered by a local temperature enhancement that gives rise to thermal stresses leading to the generation of dislocations. Damage is initially localized in the QW, and when it propagates to the waveguide layers the laser ends its life.Junta de Castilla y León (programa de apoyo a proyectos de investigación – Ref. VA302U13)Elsevier2016info:eu-repo/semantics/articleapplication/pdfhttps://doi.org/10.1016/j.microrel.2016.07.038http://uvadoc.uva.es/handle/10324/21770reponame:UVaDOC. Repositorio Documental de la Universidad de Valladolidinstname:Universidad de ValladolidIngléshttp://www.journals.elsevier.com/microelectronics-reliability/info:eu-repo/semantics/openAccesshttp://creativecommons.org/licenses/by-nc-nd/4.0/oai:uvadoc.uva.es:10324/217702026-06-13T12:44:47Z |
| dc.title.none.fl_str_mv |
Catastrophic optical damage of high power InGaAs/AlGaAs laser diodes |
| title |
Catastrophic optical damage of high power InGaAs/AlGaAs laser diodes |
| spellingShingle |
Catastrophic optical damage of high power InGaAs/AlGaAs laser diodes Souto Bartolomé, Jorge Manuel Cathodoluminescence |
| title_short |
Catastrophic optical damage of high power InGaAs/AlGaAs laser diodes |
| title_full |
Catastrophic optical damage of high power InGaAs/AlGaAs laser diodes |
| title_fullStr |
Catastrophic optical damage of high power InGaAs/AlGaAs laser diodes |
| title_full_unstemmed |
Catastrophic optical damage of high power InGaAs/AlGaAs laser diodes |
| title_sort |
Catastrophic optical damage of high power InGaAs/AlGaAs laser diodes |
| dc.creator.none.fl_str_mv |
Souto Bartolomé, Jorge Manuel Pura Ruiz, José Luis Torres, Alfredo Jiménez López, Juan Ignacio Bettiati, Mauro Laruelle, Francois |
| author |
Souto Bartolomé, Jorge Manuel |
| author_facet |
Souto Bartolomé, Jorge Manuel Pura Ruiz, José Luis Torres, Alfredo Jiménez López, Juan Ignacio Bettiati, Mauro Laruelle, Francois |
| author_role |
author |
| author2 |
Pura Ruiz, José Luis Torres, Alfredo Jiménez López, Juan Ignacio Bettiati, Mauro Laruelle, Francois |
| author2_role |
author author author author author |
| dc.subject.none.fl_str_mv |
Cathodoluminescence |
| topic |
Cathodoluminescence |
| description |
Producción Científica |
| publishDate |
2016 |
| dc.date.none.fl_str_mv |
2016 |
| dc.type.none.fl_str_mv |
info:eu-repo/semantics/article |
| format |
article |
| dc.identifier.none.fl_str_mv |
https://doi.org/10.1016/j.microrel.2016.07.038 http://uvadoc.uva.es/handle/10324/21770 |
| url |
https://doi.org/10.1016/j.microrel.2016.07.038 http://uvadoc.uva.es/handle/10324/21770 |
| dc.language.none.fl_str_mv |
Inglés |
| language_invalid_str_mv |
Inglés |
| dc.relation.none.fl_str_mv |
http://www.journals.elsevier.com/microelectronics-reliability/ |
| dc.rights.none.fl_str_mv |
info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by-nc-nd/4.0/ |
| eu_rights_str_mv |
openAccess |
| rights_invalid_str_mv |
http://creativecommons.org/licenses/by-nc-nd/4.0/ |
| dc.format.none.fl_str_mv |
application/pdf |
| dc.publisher.none.fl_str_mv |
Elsevier |
| publisher.none.fl_str_mv |
Elsevier |
| dc.source.none.fl_str_mv |
reponame:UVaDOC. Repositorio Documental de la Universidad de Valladolid instname:Universidad de Valladolid |
| instname_str |
Universidad de Valladolid |
| reponame_str |
UVaDOC. Repositorio Documental de la Universidad de Valladolid |
| collection |
UVaDOC. Repositorio Documental de la Universidad de Valladolid |
| repository.name.fl_str_mv |
|
| repository.mail.fl_str_mv |
|
| _version_ |
1869405193641132032 |
| score |
15,300719 |