Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometry

We introduce a new measurement system called Nanopolar interferometer devoted to monitor and characterize single nanoparticles which is based on the interferometric phase modulated ellipsometry technique. The system collects the backscattered light by the particles in the solid angle subtended by a...

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Detalhes bibliográficos
Autores: Barroso, F., Bosch i Puig, Salvador, Tort Escribà, Núria, Arteaga Barriel, Oriol, Sancho i Parramon, Jordi, Jover, Eric, Bertrán Serra, Enric, Canillas i Biosca, Adolf
Tipo de documento: artigo
Estado:Versión aceptada para publicación
Data de publicação:2010
País:España
Recursos:Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya)
Repositório:Recercat. Dipósit de la Recerca de Catalunya
OAI Identifier:oai:recercat.cat:2445/98142
Acesso em linha:https://hdl.handle.net/2445/98142
Access Level:Acceso aberto
Palavra-chave:El·lipsometria
Nanoestructures
Interferometria
Ellipsometry
Nanostructures
Interferometry
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spelling Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometryBarroso, F.Bosch i Puig, SalvadorTort Escribà, NúriaArteaga Barriel, OriolSancho i Parramon, JordiJover, EricBertrán Serra, EnricCanillas i Biosca, AdolfEl·lipsometriaNanoestructuresInterferometriaEllipsometryNanostructuresInterferometryWe introduce a new measurement system called Nanopolar interferometer devoted to monitor and characterize single nanoparticles which is based on the interferometric phase modulated ellipsometry technique. The system collects the backscattered light by the particles in the solid angle subtended by a microscope objective and then analyses its frequency components. The results for the detection of 2 μm and 50 nm particles are explained in terms of a cross polarization effect of the polarization vectors when the beam converts from divergent to parallel in the microscope objective. This explanation is supported with the results of the optical modelling using the exact Mie theory for the light scattered by the particles.Elsevier B.V.2016201620102016info:eu-repo/semantics/articleinfo:eu-repo/semantics/acceptedVersion5 p.application/pdfhttps://hdl.handle.net/2445/98142Articles publicats en revistes (Física Aplicada)reponame:Recercat. Dipósit de la Recerca de Catalunyainstname:Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya)InglésVersió postprint del document publicat a: http://dx.doi.org/10.1016/j.tsf.2010.12.051Thin Solid Films, 2010, vol. 519, p. 2801-2805http://dx.doi.org/10.1016/j.tsf.2010.12.051(c) Elsevier B.V., 2010info:eu-repo/semantics/openAccessoai:recercat.cat:2445/981422026-05-29T05:05:01Z
dc.title.none.fl_str_mv Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometry
title Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometry
spellingShingle Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometry
Barroso, F.
El·lipsometria
Nanoestructures
Interferometria
Ellipsometry
Nanostructures
Interferometry
title_short Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometry
title_full Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometry
title_fullStr Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometry
title_full_unstemmed Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometry
title_sort Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometry
dc.creator.none.fl_str_mv Barroso, F.
Bosch i Puig, Salvador
Tort Escribà, Núria
Arteaga Barriel, Oriol
Sancho i Parramon, Jordi
Jover, Eric
Bertrán Serra, Enric
Canillas i Biosca, Adolf
author Barroso, F.
author_facet Barroso, F.
Bosch i Puig, Salvador
Tort Escribà, Núria
Arteaga Barriel, Oriol
Sancho i Parramon, Jordi
Jover, Eric
Bertrán Serra, Enric
Canillas i Biosca, Adolf
author_role author
author2 Bosch i Puig, Salvador
Tort Escribà, Núria
Arteaga Barriel, Oriol
Sancho i Parramon, Jordi
Jover, Eric
Bertrán Serra, Enric
Canillas i Biosca, Adolf
author2_role author
author
author
author
author
author
author
dc.subject.none.fl_str_mv El·lipsometria
Nanoestructures
Interferometria
Ellipsometry
Nanostructures
Interferometry
topic El·lipsometria
Nanoestructures
Interferometria
Ellipsometry
Nanostructures
Interferometry
description We introduce a new measurement system called Nanopolar interferometer devoted to monitor and characterize single nanoparticles which is based on the interferometric phase modulated ellipsometry technique. The system collects the backscattered light by the particles in the solid angle subtended by a microscope objective and then analyses its frequency components. The results for the detection of 2 μm and 50 nm particles are explained in terms of a cross polarization effect of the polarization vectors when the beam converts from divergent to parallel in the microscope objective. This explanation is supported with the results of the optical modelling using the exact Mie theory for the light scattered by the particles.
publishDate 2010
dc.date.none.fl_str_mv 2010
2016
2016
2016
dc.type.none.fl_str_mv info:eu-repo/semantics/article
info:eu-repo/semantics/acceptedVersion
format article
status_str acceptedVersion
dc.identifier.none.fl_str_mv https://hdl.handle.net/2445/98142
url https://hdl.handle.net/2445/98142
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.relation.none.fl_str_mv Versió postprint del document publicat a: http://dx.doi.org/10.1016/j.tsf.2010.12.051
Thin Solid Films, 2010, vol. 519, p. 2801-2805
http://dx.doi.org/10.1016/j.tsf.2010.12.051
dc.rights.none.fl_str_mv (c) Elsevier B.V., 2010
info:eu-repo/semantics/openAccess
rights_invalid_str_mv (c) Elsevier B.V., 2010
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv 5 p.
application/pdf
dc.publisher.none.fl_str_mv Elsevier B.V.
publisher.none.fl_str_mv Elsevier B.V.
dc.source.none.fl_str_mv Articles publicats en revistes (Física Aplicada)
reponame:Recercat. Dipósit de la Recerca de Catalunya
instname:Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya)
instname_str Varias* (Consorci de Biblioteques Universitáries de Catalunya, Centre de Serveis Científics i Acadèmics de Catalunya)
reponame_str Recercat. Dipósit de la Recerca de Catalunya
collection Recercat. Dipósit de la Recerca de Catalunya
repository.name.fl_str_mv
repository.mail.fl_str_mv
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score 15,81155

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