Ruiz Flores, A., Claramunt, S., Crespo Yepes, A., Porti i Pujal, M., Nafria, M., Xu, H., . . . Wu, Q. (2021). Exploiting the KPFM capabilities to analyze at the nanoscale the impact of electrical stresses on OTFTs properties.
Citación estilo ChicagoRuiz Flores, Ana|||0000-0002-2475-7353, Sergi|||0000-0002-2888-7825 Claramunt, Albert|||0000-0003-4618-651X Crespo Yepes, Marc|||0000-0001-7438-3823 Porti i Pujal, Montserrat|||0000-0002-9549-2890 Nafria, H. Xu, C. Liu, y Q. Wu. Exploiting the KPFM Capabilities to Analyze At the Nanoscale the Impact of Electrical Stresses On OTFTs Properties. 2021.
Cita MLARuiz Flores, Ana|||0000-0002-2475-7353, et al. Exploiting the KPFM Capabilities to Analyze At the Nanoscale the Impact of Electrical Stresses On OTFTs Properties. 2021.