Measurement of retardation in digital photoelasticity by load stepping using a sinusoidal least-squares fitting

The use of digital photoelasticity permits us to determine the distribution of principal stress difference by means of the analysis of a photoelastic fringe pattern using a phase measurement method. However, conventional phase measurement methods for fringe pattern analysis require the application o...

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Detalles Bibliográficos
Autores: Quiroga Mellado, Juan Antonio, Villa, J., Gómez Pedrero, José Antonio
Tipo de recurso: artículo
Fecha de publicación:2004
País:España
Institución:Universidad Complutense de Madrid (UCM)
Repositorio:Docta Complutense
Idioma:inglés
OAI Identifier:oai:docta.ucm.es:20.500.14352/50819
Acceso en línea:https://hdl.handle.net/20.500.14352/50819
Access Level:acceso abierto
Palabra clave:535
Digital Photoelasticity
Retardation
Load-Stepping
Non-Linear Sinusoidal Least-Squares Fitting
Óptica (Física)
2209.19 Óptica Física
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oai_identifier_str oai:docta.ucm.es:20.500.14352/50819
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repository_id_str
spelling Measurement of retardation in digital photoelasticity by load stepping using a sinusoidal least-squares fittingQuiroga Mellado, Juan AntonioVilla, J.Gómez Pedrero, José Antonio535Digital PhotoelasticityRetardationLoad-SteppingNon-Linear Sinusoidal Least-Squares FittingÓptica (Física)2209.19 Óptica FísicaThe use of digital photoelasticity permits us to determine the distribution of principal stress difference by means of the analysis of a photoelastic fringe pattern using a phase measurement method. However, conventional phase measurement methods for fringe pattern analysis require the application of an unwrapping process which commonly fails in the presence of discontinuities. To alleviate this problem, load-stepping methods have been developed. We present an alternative load-stepping algorithm that is based on a nonlinear sinusoidal least-squares fitting. The description of this technique together with its verification on simulated and real experiments are presented in this work. © 2002 Elsevier Science Ltd. All rights reserved.Elsevier Sci. Ltd.Universidad Complutense de Madrid20042004-01-0120042004-01-01journal articlehttp://purl.org/coar/resource_type/c_6501info:eu-repo/semantics/articleapplication/pdfhttps://hdl.handle.net/20.500.14352/50819reponame:Docta Complutenseinstname:Universidad Complutense de Madrid (UCM)Inglésengopen accesshttp://purl.org/coar/access_right/c_abf2info:eu-repo/semantics/openAccessoai:docta.ucm.es:20.500.14352/508192026-06-02T12:44:21Z
dc.title.none.fl_str_mv Measurement of retardation in digital photoelasticity by load stepping using a sinusoidal least-squares fitting
title Measurement of retardation in digital photoelasticity by load stepping using a sinusoidal least-squares fitting
spellingShingle Measurement of retardation in digital photoelasticity by load stepping using a sinusoidal least-squares fitting
Quiroga Mellado, Juan Antonio
535
Digital Photoelasticity
Retardation
Load-Stepping
Non-Linear Sinusoidal Least-Squares Fitting
Óptica (Física)
2209.19 Óptica Física
title_short Measurement of retardation in digital photoelasticity by load stepping using a sinusoidal least-squares fitting
title_full Measurement of retardation in digital photoelasticity by load stepping using a sinusoidal least-squares fitting
title_fullStr Measurement of retardation in digital photoelasticity by load stepping using a sinusoidal least-squares fitting
title_full_unstemmed Measurement of retardation in digital photoelasticity by load stepping using a sinusoidal least-squares fitting
title_sort Measurement of retardation in digital photoelasticity by load stepping using a sinusoidal least-squares fitting
dc.creator.none.fl_str_mv Quiroga Mellado, Juan Antonio
Villa, J.
Gómez Pedrero, José Antonio
author Quiroga Mellado, Juan Antonio
author_facet Quiroga Mellado, Juan Antonio
Villa, J.
Gómez Pedrero, José Antonio
author_role author
author2 Villa, J.
Gómez Pedrero, José Antonio
author2_role author
author
dc.contributor.none.fl_str_mv Universidad Complutense de Madrid
dc.subject.none.fl_str_mv 535
Digital Photoelasticity
Retardation
Load-Stepping
Non-Linear Sinusoidal Least-Squares Fitting
Óptica (Física)
2209.19 Óptica Física
topic 535
Digital Photoelasticity
Retardation
Load-Stepping
Non-Linear Sinusoidal Least-Squares Fitting
Óptica (Física)
2209.19 Óptica Física
description The use of digital photoelasticity permits us to determine the distribution of principal stress difference by means of the analysis of a photoelastic fringe pattern using a phase measurement method. However, conventional phase measurement methods for fringe pattern analysis require the application of an unwrapping process which commonly fails in the presence of discontinuities. To alleviate this problem, load-stepping methods have been developed. We present an alternative load-stepping algorithm that is based on a nonlinear sinusoidal least-squares fitting. The description of this technique together with its verification on simulated and real experiments are presented in this work. © 2002 Elsevier Science Ltd. All rights reserved.
publishDate 2004
dc.date.none.fl_str_mv 2004
2004-01-01
2004
2004-01-01
dc.type.none.fl_str_mv journal article
http://purl.org/coar/resource_type/c_6501
dc.type.openaire.fl_str_mv info:eu-repo/semantics/article
format article
dc.identifier.none.fl_str_mv https://hdl.handle.net/20.500.14352/50819
url https://hdl.handle.net/20.500.14352/50819
dc.language.none.fl_str_mv Inglés
eng
language_invalid_str_mv Inglés
language eng
dc.rights.none.fl_str_mv open access
http://purl.org/coar/access_right/c_abf2
dc.rights.openaire.fl_str_mv info:eu-repo/semantics/openAccess
rights_invalid_str_mv open access
http://purl.org/coar/access_right/c_abf2
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv Elsevier Sci. Ltd.
publisher.none.fl_str_mv Elsevier Sci. Ltd.
dc.source.none.fl_str_mv reponame:Docta Complutense
instname:Universidad Complutense de Madrid (UCM)
instname_str Universidad Complutense de Madrid (UCM)
reponame_str Docta Complutense
collection Docta Complutense
repository.name.fl_str_mv
repository.mail.fl_str_mv
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score 15,301603

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