Monolithic sensor integration in CMOS technologies

© 2023 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes,creating new collective works, for resale or redistribution to se...

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Autores: Fernández, Daniel, Michalik, Piotr, Valle Fraga, Juan José, Banerji, Saoni, Sánchez Chiva, José María|||0000-0002-1101-6804, Madrenas Boadas, Jordi|||0000-0001-5905-9179
Tipo de recurso: artículo
Fecha de publicación:2022
País:España
Institución:Universitat Politècnica de Catalunya (UPC)
Repositorio:UPCommons. Portal del coneixement obert de la UPC
Idioma:inglés
OAI Identifier:oai:upcommons.upc.edu:2117/384934
Acceso en línea:https://hdl.handle.net/2117/384934
https://dx.doi.org/10.1109/JSEN.2022.3224866
Access Level:acceso abierto
Palabra clave:Metal oxide semiconductors, Complementary
CMOS sensors
CMOS-micro-electromechanical system (MEMS)
Micromachining
Monolithic integration
System-on-chip (SoC)
Metall-òxid-semiconductors complementaris
Àrees temàtiques de la UPC::Enginyeria electrònica::Components electrònics
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Sumario:© 2023 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes,creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.