A novel active gate driver for improving SiC MOSFET switching trajectory

The trend in power electronic applications is to reach higher power density and higher efficiency. Currently, the wide band-gap devices such as silicon carbide MOSFET (SiC MOSFET) are of great interest because they can work at higher switching frequency with low losses. The increase of the switching...

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Detalles Bibliográficos
Autores: Paredes Camacho, Alejandro|||0000-0003-1230-4063, Sala Caselles, Vicenç|||0000-0001-5001-7431, Ghorbani, Hamidreza|||0000-0001-9814-3277, Romeral Martínez, José Luis|||0000-0001-8112-8038
Tipo de recurso: artículo
Fecha de publicación:2017
País:España
Institución:Universitat Politècnica de Catalunya (UPC)
Repositorio:UPCommons. Portal del coneixement obert de la UPC
Idioma:inglés
OAI Identifier:oai:upcommons.upc.edu:2117/116639
Acceso en línea:https://hdl.handle.net/2117/116639
https://dx.doi.org/10.1109/TIE.2017.2719603
Access Level:acceso abierto
Palabra clave:Electronic apparatus and appliances
Driver circuits
electromagnetic interference (EMI)
silicon carbide (SiC) MOSFET
switching losses
switching transients
Electrònica -- Aparells i instruments
Enginyeria elèctrica
Enginyeria electrònica
Metall-òxid-semiconductors
Àrees temàtiques de la UPC::Enginyeria electrònica
Descripción
Sumario:The trend in power electronic applications is to reach higher power density and higher efficiency. Currently, the wide band-gap devices such as silicon carbide MOSFET (SiC MOSFET) are of great interest because they can work at higher switching frequency with low losses. The increase of the switching speed in power devices leads to high power density systems. However, this can generate problems such as overshoots, oscillations, additional losses, and electromagnetic interference (EMI). In this paper, a novel active gate driver (AGD) for improving the SiC MOSFET switching trajectory with high performance is presented. The AGD is an open-loop control system and its principle is based on gate energy decrease with a gate resistance increment during the Miller plateau effect on gate-source voltage. The proposed AGD has been designed and validated through experimental tests for high-frequency operation. Moreover, an EMI discussion and a performance analysis were realized for the AGD. The results show that the AGD can reduce the overshoots, oscillations, and losses without compromising the EMI. In addition, the AGD can control the turn-on and turn-off transitions separately, and it is suitable for working with asymmetrical supplies required by SiC MOSFETs.