Testing two techniques for wavefront analysis. Specific applications and comparative study
This work focuses on the description of two different techniques for characterizing wavefronts: by using Shack-Hartmann (SH) sensor and by using Point Diffraction Interferometer (PDI). Moreover describes application examples of each in recent research, and finally a comparative study of both techniq...
| Autores: | , , , |
|---|---|
| Tipo de recurso: | artículo |
| Fecha de publicación: | 2017 |
| País: | España |
| Institución: | Universitat Politècnica de Catalunya (UPC) |
| Repositorio: | UPCommons. Portal del coneixement obert de la UPC |
| Idioma: | inglés |
| OAI Identifier: | oai:upcommons.upc.edu:2117/346076 |
| Acceso en línea: | https://hdl.handle.net/2117/346076 https://dx.doi.org/10.7149/OPA.50.4.49022 |
| Access Level: | acceso abierto |
| Palabra clave: | Optics, Adaptive Aberración de frente de onda Examen de sistemas ópticos Polinomios de Zernike Sensor Shack-Hartmann Interferómetro de difracción por orificio Evaluación de la calidad de imagen Òptica aplicada Àrees temàtiques de la UPC::Ciències de la visió::Òptica física |
| Sumario: | This work focuses on the description of two different techniques for characterizing wavefronts: by using Shack-Hartmann (SH) sensor and by using Point Diffraction Interferometer (PDI). Moreover describes application examples of each in recent research, and finally a comparative study of both techniques on a single optical system is performed. |
|---|