Planar Phase-Variation Microwave Sensors for Material Characterization
Planar phase-variation microwave sensors have attracted increasing interest in recent years since they combine the advantages of planar technology (including low cost, low profile, and sensor integration with the associated circuitry for post-processing and communication purposes, among others) and...
| Autores: | , , , , , , |
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| Tipo de recurso: | artículo |
| Fecha de publicación: | 2021 |
| País: | España |
| Institución: | Universitat Autònoma de Barcelona |
| Repositorio: | Dipòsit Digital de Documents de la UAB |
| Idioma: | inglés |
| OAI Identifier: | oai:ddd.uab.cat:237013 |
| Acceso en línea: | https://ddd.uab.cat/record/237013 https://dx.doi.org/urn:doi:10.3390/s21041542 |
| Access Level: | acceso abierto |
| Palabra clave: | Microwave sensors Stepped-impedance transmission lines Slow-wave transmission lines Meander lines Dielectric constant sensor Phase-variation sensors |
| Sumario: | Planar phase-variation microwave sensors have attracted increasing interest in recent years since they combine the advantages of planar technology (including low cost, low profile, and sensor integration with the associated circuitry for post-processing and communication purposes, among others) and the possibility of operation at a single frequency (thereby reducing the costs of the associated electronics). This paper reviews and compares three different strategies for sensitivity improvement in such phase-variation sensors (devoted to material characterization). The considered approaches include line elongation (through meandering), dispersion engineering (by considering slow-wave artificial transmission lines), and reflective-mode sensors based on step-impedance open-ended lines. It is shown that unprecedented sensitivities compatible with small sensing regions are achievable with the latter approach. |
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