On the Effect of Thin Film Growth Mechanisms on the Specular Reflectance of Aluminium Thin Films Deposited via Filtered Cathodic Vacuum Arc

[EN]The optimisation of the specular reflectance of solar collectors is a key parameter to increase the global yield of concentrated solar power (CSP) plants. In this work, the influence of filtered cathodic vacuum arc deposition parameters, particularly working pressure and deposition time, on the...

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Authors: Rincón-Llorente, Gonzalo, Heras Pérez, Irene, Guillén, Elena, Schumann, Erik, Krauser, Matthias, Escobar-Galindo, Ramón
Format: article
Publication Date:2018
Country:España
Institution:Universidad de Salamanca (USAL)
Repository:GREDOS. Repositorio Institucional de la Universidad de Salamanca
OAI Identifier:oai:gredos.usal.es:10366/138619
Online Access:http://hdl.handle.net/10366/138619
Access Level:Open access
Keyword:Surface engineering
Filtered cathodic vacuum arc
Total and specular reflectance
Thin film deposition conditions
Structural characterisation
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spelling On the Effect of Thin Film Growth Mechanisms on the Specular Reflectance of Aluminium Thin Films Deposited via Filtered Cathodic Vacuum ArcRincón-Llorente, GonzaloHeras Pérez, IreneGuillén, ElenaSchumann, ErikKrauser, MatthiasEscobar-Galindo, RamónSurface engineeringFiltered cathodic vacuum arcTotal and specular reflectanceThin film deposition conditionsStructural characterisation[EN]The optimisation of the specular reflectance of solar collectors is a key parameter to increase the global yield of concentrated solar power (CSP) plants. In this work, the influence of filtered cathodic vacuum arc deposition parameters, particularly working pressure and deposition time, on the specular and diffuse reflectance of aluminium thin films, was studied. Changes in specular reflectance, measured by ultraviolet–visible and near-infrared spectroscopy (UV-vis-NIR) spectrophotometry, were directly correlated with thin film elemental concentration depth profiles, obtained by Rutherford backscattering spectrometry (RBS), and surface and cross-sectional morphologies as measured by scanning electron microscopy (SEM) and profilometry. Finally, atomic force microscopy (AFM) provided information on the roughness and growth mechanism of the films. The two contributions to the total reflectance of the films, namely diffuse and specular reflectance, were found to be deeply influenced by deposition conditions. It was proven that working pressure and deposition time directly determine the predominant factor. Specular reflectance varied from 12 to 99.8% of the total reflectance for films grown at the same working pressure of 0.1 Pa and with different deposition times. This transformation could not be attributed to an oxidation of the films as stated by RBS, but was correlated with a progressive modification of the roughness, surface, and bulk morphology of the samples over the deposition time. Hence, the evolution in the final optical properties of the films is driven by different growth mechanisms and the resulting microstructures. In addition to the originally addressed CSP applications the potential of the developed aluminium films for other application rather than CSP, such as, for example, reference material for spectroscopic diffuse reflectance measurements, is also discussed]Junta de Castilla y León (SA017P17); EU H2020 RISE project; FRIENDS2, GA-645725MDPI201820182018info:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/10366/138619reponame:GREDOS. Repositorio Institucional de la Universidad de Salamancainstname:Universidad de Salamanca (USAL)InglésAttribution 4.0 Internacionalhttp://creativecommons.org/licenses/by/4.0/info:eu-repo/semantics/openAccessoai:gredos.usal.es:10366/1386192026-06-07T06:28:51Z
dc.title.none.fl_str_mv On the Effect of Thin Film Growth Mechanisms on the Specular Reflectance of Aluminium Thin Films Deposited via Filtered Cathodic Vacuum Arc
title On the Effect of Thin Film Growth Mechanisms on the Specular Reflectance of Aluminium Thin Films Deposited via Filtered Cathodic Vacuum Arc
spellingShingle On the Effect of Thin Film Growth Mechanisms on the Specular Reflectance of Aluminium Thin Films Deposited via Filtered Cathodic Vacuum Arc
Rincón-Llorente, Gonzalo
Surface engineering
Filtered cathodic vacuum arc
Total and specular reflectance
Thin film deposition conditions
Structural characterisation
title_short On the Effect of Thin Film Growth Mechanisms on the Specular Reflectance of Aluminium Thin Films Deposited via Filtered Cathodic Vacuum Arc
title_full On the Effect of Thin Film Growth Mechanisms on the Specular Reflectance of Aluminium Thin Films Deposited via Filtered Cathodic Vacuum Arc
title_fullStr On the Effect of Thin Film Growth Mechanisms on the Specular Reflectance of Aluminium Thin Films Deposited via Filtered Cathodic Vacuum Arc
title_full_unstemmed On the Effect of Thin Film Growth Mechanisms on the Specular Reflectance of Aluminium Thin Films Deposited via Filtered Cathodic Vacuum Arc
title_sort On the Effect of Thin Film Growth Mechanisms on the Specular Reflectance of Aluminium Thin Films Deposited via Filtered Cathodic Vacuum Arc
dc.creator.none.fl_str_mv Rincón-Llorente, Gonzalo
Heras Pérez, Irene
Guillén, Elena
Schumann, Erik
Krauser, Matthias
Escobar-Galindo, Ramón
author Rincón-Llorente, Gonzalo
author_facet Rincón-Llorente, Gonzalo
Heras Pérez, Irene
Guillén, Elena
Schumann, Erik
Krauser, Matthias
Escobar-Galindo, Ramón
author_role author
author2 Heras Pérez, Irene
Guillén, Elena
Schumann, Erik
Krauser, Matthias
Escobar-Galindo, Ramón
author2_role author
author
author
author
author
dc.subject.none.fl_str_mv Surface engineering
Filtered cathodic vacuum arc
Total and specular reflectance
Thin film deposition conditions
Structural characterisation
topic Surface engineering
Filtered cathodic vacuum arc
Total and specular reflectance
Thin film deposition conditions
Structural characterisation
description [EN]The optimisation of the specular reflectance of solar collectors is a key parameter to increase the global yield of concentrated solar power (CSP) plants. In this work, the influence of filtered cathodic vacuum arc deposition parameters, particularly working pressure and deposition time, on the specular and diffuse reflectance of aluminium thin films, was studied. Changes in specular reflectance, measured by ultraviolet–visible and near-infrared spectroscopy (UV-vis-NIR) spectrophotometry, were directly correlated with thin film elemental concentration depth profiles, obtained by Rutherford backscattering spectrometry (RBS), and surface and cross-sectional morphologies as measured by scanning electron microscopy (SEM) and profilometry. Finally, atomic force microscopy (AFM) provided information on the roughness and growth mechanism of the films. The two contributions to the total reflectance of the films, namely diffuse and specular reflectance, were found to be deeply influenced by deposition conditions. It was proven that working pressure and deposition time directly determine the predominant factor. Specular reflectance varied from 12 to 99.8% of the total reflectance for films grown at the same working pressure of 0.1 Pa and with different deposition times. This transformation could not be attributed to an oxidation of the films as stated by RBS, but was correlated with a progressive modification of the roughness, surface, and bulk morphology of the samples over the deposition time. Hence, the evolution in the final optical properties of the films is driven by different growth mechanisms and the resulting microstructures. In addition to the originally addressed CSP applications the potential of the developed aluminium films for other application rather than CSP, such as, for example, reference material for spectroscopic diffuse reflectance measurements, is also discussed]
publishDate 2018
dc.date.none.fl_str_mv 2018
2018
2018
dc.type.none.fl_str_mv info:eu-repo/semantics/article
format article
dc.identifier.none.fl_str_mv http://hdl.handle.net/10366/138619
url http://hdl.handle.net/10366/138619
dc.language.none.fl_str_mv Inglés
language_invalid_str_mv Inglés
dc.rights.none.fl_str_mv Attribution 4.0 Internacional
http://creativecommons.org/licenses/by/4.0/
info:eu-repo/semantics/openAccess
rights_invalid_str_mv Attribution 4.0 Internacional
http://creativecommons.org/licenses/by/4.0/
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv MDPI
publisher.none.fl_str_mv MDPI
dc.source.none.fl_str_mv reponame:GREDOS. Repositorio Institucional de la Universidad de Salamanca
instname:Universidad de Salamanca (USAL)
instname_str Universidad de Salamanca (USAL)
reponame_str GREDOS. Repositorio Institucional de la Universidad de Salamanca
collection GREDOS. Repositorio Institucional de la Universidad de Salamanca
repository.name.fl_str_mv
repository.mail.fl_str_mv
_version_ 1869403302781779968
score 15,301603

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