Cita APA

González Díaz, G., Artús, L., Blanco, N., Cuscó, R., Ibáñez, J., Long, A., & Rahman, M. (2000). Comparison of Raman-scattering and Shubnikov-de Haas measurements to determine charge density in doped semiconductors.

Citación estilo Chicago

González Díaz, Germán, L. Artús, N. Blanco, R. Cuscó, J. Ibáñez, A.R Long, y M. Rahman. Comparison of Raman-scattering and Shubnikov-de Haas Measurements to Determine Charge Density in Doped Semiconductors. 2000.

Cita MLA

González Díaz, Germán, et al. Comparison of Raman-scattering and Shubnikov-de Haas Measurements to Determine Charge Density in Doped Semiconductors. 2000.