Improving the lateral resolution of quartz tuning fork-based sensors in liquid by integrating commercial AFM tips into the fiber end

The use of quartz tuning fork sensors as probes for scanning probe microscopy is growing in popularity. Working in shear mode, some methods achieve a lateral resolution comparable with that obtained with standard cantilevered probes, but only in experiments conducted in air or vacuum. Here, we repor...

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Detalles Bibliográficos
Autores: Gonzalez, Laura, Martínez-Martín, David, Otero, Jorge, Pablo Gómez, Pedro José de, Puig-Vidal, Manel, Gómez Herrero, Julio
Tipo de recurso: artículo
Fecha de publicación:2015
País:España
Institución:Universidad Autónoma de Madrid
Repositorio:Biblos-e Archivo. Repositorio Institucional de la UAM
Idioma:inglés
OAI Identifier:oai:repositorio.uam.es:10486/673007
Acceso en línea:http://hdl.handle.net/10486/673007
https://dx.doi.org/10.3390/s150101601
Access Level:acceso abierto
Palabra clave:Atomic force microscopy
Nanotip
Quartz tuning fork
Scanning probe microscopy
Self-sensing probe
Shear force microscopy
Física
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spelling Improving the lateral resolution of quartz tuning fork-based sensors in liquid by integrating commercial AFM tips into the fiber endGonzalez, LauraMartínez-Martín, DavidOtero, JorgePablo Gómez, Pedro José dePuig-Vidal, ManelGómez Herrero, JulioAtomic force microscopyNanotipQuartz tuning forkScanning probe microscopySelf-sensing probeShear force microscopyFísicaThe use of quartz tuning fork sensors as probes for scanning probe microscopy is growing in popularity. Working in shear mode, some methods achieve a lateral resolution comparable with that obtained with standard cantilevered probes, but only in experiments conducted in air or vacuum. Here, we report a method to produce and use commercial AFM tips in electrically driven quartz tuning fork sensors operating in shear mode in a liquid environment. The process is based on attaching a standard AFM tip to the end of a fiber probe which has previously been sharpened. Only the end of the probe is immersed in the buffer solution during imaging. The lateral resolution achieved is about 6 times higher than that of the etched microfiber on its ownMDPI AGDepartamento de Física de la Materia CondensadaFacultad de Ciencias20152015-01-14research articlehttp://purl.org/coar/resource_type/c_2df8fbb1VoRhttp://purl.org/coar/version/c_970fb48d4fbd8a85info:eu-repo/semantics/articleapplication/pdfhttp://hdl.handle.net/10486/673007https://dx.doi.org/10.3390/s150101601reponame:Biblos-e Archivo. Repositorio Institucional de la UAMinstname:Universidad Autónoma de MadridInglésengopen accesshttp://purl.org/coar/access_right/c_abf2info:eu-repo/semantics/openAccessoai:repositorio.uam.es:10486/6730072026-06-23T12:46:27Z
dc.title.none.fl_str_mv Improving the lateral resolution of quartz tuning fork-based sensors in liquid by integrating commercial AFM tips into the fiber end
title Improving the lateral resolution of quartz tuning fork-based sensors in liquid by integrating commercial AFM tips into the fiber end
spellingShingle Improving the lateral resolution of quartz tuning fork-based sensors in liquid by integrating commercial AFM tips into the fiber end
Gonzalez, Laura
Atomic force microscopy
Nanotip
Quartz tuning fork
Scanning probe microscopy
Self-sensing probe
Shear force microscopy
Física
title_short Improving the lateral resolution of quartz tuning fork-based sensors in liquid by integrating commercial AFM tips into the fiber end
title_full Improving the lateral resolution of quartz tuning fork-based sensors in liquid by integrating commercial AFM tips into the fiber end
title_fullStr Improving the lateral resolution of quartz tuning fork-based sensors in liquid by integrating commercial AFM tips into the fiber end
title_full_unstemmed Improving the lateral resolution of quartz tuning fork-based sensors in liquid by integrating commercial AFM tips into the fiber end
title_sort Improving the lateral resolution of quartz tuning fork-based sensors in liquid by integrating commercial AFM tips into the fiber end
dc.creator.none.fl_str_mv Gonzalez, Laura
Martínez-Martín, David
Otero, Jorge
Pablo Gómez, Pedro José de
Puig-Vidal, Manel
Gómez Herrero, Julio
author Gonzalez, Laura
author_facet Gonzalez, Laura
Martínez-Martín, David
Otero, Jorge
Pablo Gómez, Pedro José de
Puig-Vidal, Manel
Gómez Herrero, Julio
author_role author
author2 Martínez-Martín, David
Otero, Jorge
Pablo Gómez, Pedro José de
Puig-Vidal, Manel
Gómez Herrero, Julio
author2_role author
author
author
author
author
dc.contributor.none.fl_str_mv Departamento de Física de la Materia Condensada
Facultad de Ciencias
dc.subject.none.fl_str_mv Atomic force microscopy
Nanotip
Quartz tuning fork
Scanning probe microscopy
Self-sensing probe
Shear force microscopy
Física
topic Atomic force microscopy
Nanotip
Quartz tuning fork
Scanning probe microscopy
Self-sensing probe
Shear force microscopy
Física
description The use of quartz tuning fork sensors as probes for scanning probe microscopy is growing in popularity. Working in shear mode, some methods achieve a lateral resolution comparable with that obtained with standard cantilevered probes, but only in experiments conducted in air or vacuum. Here, we report a method to produce and use commercial AFM tips in electrically driven quartz tuning fork sensors operating in shear mode in a liquid environment. The process is based on attaching a standard AFM tip to the end of a fiber probe which has previously been sharpened. Only the end of the probe is immersed in the buffer solution during imaging. The lateral resolution achieved is about 6 times higher than that of the etched microfiber on its own
publishDate 2015
dc.date.none.fl_str_mv 2015
2015-01-14
dc.type.none.fl_str_mv research article
http://purl.org/coar/resource_type/c_2df8fbb1
VoR
http://purl.org/coar/version/c_970fb48d4fbd8a85
dc.type.openaire.fl_str_mv info:eu-repo/semantics/article
format article
dc.identifier.none.fl_str_mv http://hdl.handle.net/10486/673007
https://dx.doi.org/10.3390/s150101601
url http://hdl.handle.net/10486/673007
https://dx.doi.org/10.3390/s150101601
dc.language.none.fl_str_mv Inglés
eng
language_invalid_str_mv Inglés
language eng
dc.rights.none.fl_str_mv open access
http://purl.org/coar/access_right/c_abf2
dc.rights.openaire.fl_str_mv info:eu-repo/semantics/openAccess
rights_invalid_str_mv open access
http://purl.org/coar/access_right/c_abf2
eu_rights_str_mv openAccess
dc.format.none.fl_str_mv application/pdf
dc.publisher.none.fl_str_mv MDPI AG
publisher.none.fl_str_mv MDPI AG
dc.source.none.fl_str_mv reponame:Biblos-e Archivo. Repositorio Institucional de la UAM
instname:Universidad Autónoma de Madrid
instname_str Universidad Autónoma de Madrid
reponame_str Biblos-e Archivo. Repositorio Institucional de la UAM
collection Biblos-e Archivo. Repositorio Institucional de la UAM
repository.name.fl_str_mv
repository.mail.fl_str_mv
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score 15,300724

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