Cita APA

Poley, L., Blue, A., Bloch, I., Buttar, C., Fadeyev, V., Fernández-Tejero, J., . . . Unno, Y. (2019). Mapping the depleted area of silicon diodes using a micro-focused X-ray beam.

Citación estilo Chicago

Poley, L., et al. Mapping the Depleted Area of Silicon Diodes Using a Micro-focused X-ray Beam. 2019.

Cita MLA

Poley, L., et al. Mapping the Depleted Area of Silicon Diodes Using a Micro-focused X-ray Beam. 2019.