Identification by force modulation microscopy of nanoparticles generated in vacuum arcs
This paper presents an alternative method based on force modulation microscopy (FMM), for the identification of nanogrobes produced in the plasma generated by the cathode spots of the arcs in a vacuum. The FMM technique is enabled for the detection of variations in the mechanical properties of a sur...
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| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2006 |
| País: | Colombia |
| Institución: | Universidad EAFIT |
| Repositorio: | Repositorio EAFIT |
| Idioma: | inglés |
| OAI Identifier: | oai:repository.eafit.edu.co:10784/14563 |
| Acceso en línea: | http://hdl.handle.net/10784/14563 |
| Access Level: | acceso abierto |
| Palabra clave: | Force Modulation Atomic Force Nanogotas Tin Ti Modulación De Fuerza Fuerza Atómica |
| Sumario: | This paper presents an alternative method based on force modulation microscopy (FMM), for the identification of nanogrobes produced in the plasma generated by the cathode spots of the arcs in a vacuum. The FMM technique is enabled for the detection of variations in the mechanical properties of a surface, with high sensitivity. Titanium nitride (TiN) coatings deposited on Silicon oriented by the pulsed arc process have been analyzed. Atomic force microscopy (AFM) and FMM microscopy images have been obtained simultaneously by means of which the presence of nanogotas has been identified. Additionally, X-ray diffraction spectra (XRD) have been taken from the coated samples. The existence of contaminating particles of 47 nanometers in diameter on the coatings has been reported. |
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