Tracks and voids in amorphous Ge induced by swift heavy-ion irradiation
Ion tracks formed in amorphous Ge by swift heavy-ion irradiation have been identified with experiment and modeling to yield unambiguous evidence of tracks in an amorphous semiconductor. Their underdense core and overdense shell result from quenched-in radially outward material flow. Following a soli...
| Autores: | , , , , , , , , , , , , , , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2013 |
| País: | Brasil |
| Institución: | Universidade Federal do Rio Grande do Sul (UFRGS) |
| Repositorio: | Repositório Institucional da UFRGS |
| Idioma: | inglés |
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2014-08-19T02:10:34Z20130031-9007http://hdl.handle.net/10183/101366000897306Ion tracks formed in amorphous Ge by swift heavy-ion irradiation have been identified with experiment and modeling to yield unambiguous evidence of tracks in an amorphous semiconductor. Their underdense core and overdense shell result from quenched-in radially outward material flow. Following a solid-toliquid phase transformation, the volume contraction necessary to accommodate the high-density molten phase produces voids, potentially the precursors to porosity, along the ion direction. Their bow-tie shape, reproduced by simulation, results from radially inward resolidification.application/pdfengPhysical review letters. New York. Vol. 110, no. 24 (June 2013), 245502, 5 p.Semicondutores amorfosSemicondutores elementaresSolidificaçãoEfeitos de feixe iônicoGermânioTracks and voids in amorphous Ge induced by swift heavy-ion irradiationEstrangeiroinfo:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersioninfo:eu-repo/semantics/openAccessreponame:Repositório Institucional da UFRGSinstname:Universidade Federal do Rio Grande do Sul (UFRGS)instacron:UFRGSRidgway, M.C.Bierschenk, ThomasGiulian, RaquelAfra, BoshraRodriguez, M. D.Araújo, Leandro LangieByrne, A. P.Kirby, NigelPakarinen, O. H.Djurabekova, F.Nordlund, K.Schleberger, M.Osmani, O.Medvedev, N.Rethfeld, B.Kluth, PatrickORIGINAL000897306.pdf000897306.pdfTexto completo (inglês)application/pdf599560http://www.lume.ufrgs.br/bitstream/10183/101366/1/000897306.pdf1c229b549b014cf5aa07e92f1646d5daMD51TEXT000897306.pdf.txt000897306.pdf.txtExtracted Texttext/plain23639http://www.lume.ufrgs.br/bitstream/10183/101366/2/000897306.pdf.txted3e9a2e273d222db3f932d4177532d2MD52THUMBNAIL000897306.pdf.jpg000897306.pdf.jpgGenerated Thumbnailimage/jpeg2095http://www.lume.ufrgs.br/bitstream/10183/101366/3/000897306.pdf.jpg6819d8e995916cbc62312745ff81cc0eMD5310183/1013662024-11-21 07:54:06.689613oai:www.lume.ufrgs.br:10183/101366Repositório InstitucionalPUBhttps://lume.ufrgs.br/oai/requestlume@ufrgs.bropendoar:2024-11-21T09:54:06Repositório Institucional da UFRGS - Universidade Federal do Rio Grande do Sul (UFRGS)false |
| dc.title.pt_BR.fl_str_mv |
Tracks and voids in amorphous Ge induced by swift heavy-ion irradiation |
| title |
Tracks and voids in amorphous Ge induced by swift heavy-ion irradiation |
| spellingShingle |
Tracks and voids in amorphous Ge induced by swift heavy-ion irradiation Ridgway, M.C. Semicondutores amorfos Semicondutores elementares Solidificação Efeitos de feixe iônico Germânio |
| title_short |
Tracks and voids in amorphous Ge induced by swift heavy-ion irradiation |
| title_full |
Tracks and voids in amorphous Ge induced by swift heavy-ion irradiation |
| title_fullStr |
Tracks and voids in amorphous Ge induced by swift heavy-ion irradiation |
| title_full_unstemmed |
Tracks and voids in amorphous Ge induced by swift heavy-ion irradiation |
| title_sort |
Tracks and voids in amorphous Ge induced by swift heavy-ion irradiation |
| dc.creator.none.fl_str_mv |
Ridgway, M.C. Bierschenk, Thomas Giulian, Raquel Afra, Boshra Rodriguez, M. D. Araújo, Leandro Langie Byrne, A. P. Kirby, Nigel Pakarinen, O. H. Djurabekova, F. Nordlund, K. Schleberger, M. Osmani, O. Medvedev, N. Rethfeld, B. Kluth, Patrick |
| author |
Ridgway, M.C. |
| author_facet |
Ridgway, M.C. Bierschenk, Thomas Giulian, Raquel Afra, Boshra Rodriguez, M. D. Araújo, Leandro Langie Byrne, A. P. Kirby, Nigel Pakarinen, O. H. Djurabekova, F. Nordlund, K. Schleberger, M. Osmani, O. Medvedev, N. Rethfeld, B. Kluth, Patrick |
| author_role |
author |
| author2 |
Bierschenk, Thomas Giulian, Raquel Afra, Boshra Rodriguez, M. D. Araújo, Leandro Langie Byrne, A. P. Kirby, Nigel Pakarinen, O. H. Djurabekova, F. Nordlund, K. Schleberger, M. Osmani, O. Medvedev, N. Rethfeld, B. Kluth, Patrick |
| author2_role |
author author author author author author author author author author author author author author author |
| dc.subject.por.fl_str_mv |
Semicondutores amorfos Semicondutores elementares Solidificação Efeitos de feixe iônico Germânio |
| topic |
Semicondutores amorfos Semicondutores elementares Solidificação Efeitos de feixe iônico Germânio |
| description |
Ion tracks formed in amorphous Ge by swift heavy-ion irradiation have been identified with experiment and modeling to yield unambiguous evidence of tracks in an amorphous semiconductor. Their underdense core and overdense shell result from quenched-in radially outward material flow. Following a solid-toliquid phase transformation, the volume contraction necessary to accommodate the high-density molten phase produces voids, potentially the precursors to porosity, along the ion direction. Their bow-tie shape, reproduced by simulation, results from radially inward resolidification. |
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2013 |
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2013 |
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2014-08-19T02:10:34Z |
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http://hdl.handle.net/10183/101366 |
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0031-9007 |
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000897306 |
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Physical review letters. New York. Vol. 110, no. 24 (June 2013), 245502, 5 p. |
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