Anomalous temperature behavior of resistance in C1-xCox thin films grown by pulsed laser deposition technique
We study the transport properties of C1-xCox thin films (with x = 0.1, 0.15 and 0.2) grown on Si substrate by pulsed laser deposition technique. The results demonstrate some anomalous effects in the behavior of the measured resistance R(T,x). More specifically, for 0 < T < T∗ range (with T∗ ≃...
| Autores: | , , , , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2016 |
| País: | Brasil |
| Institución: | Universidade Estadual Paulista (UNESP) |
| Repositorio: | Repositório Institucional da UNESP |
| Idioma: | inglés |
| OAI Identifier: | oai:repositorio.unesp.br:11449/177758 |
| Acceso en línea: | http://dx.doi.org/10.1016/j.jallcom.2016.01.141 http://hdl.handle.net/11449/177758 |
| Access Level: | acceso abierto |
| Palabra clave: | Carbon-cobalt nanocomposite Magnetic scattering Polaron hopping Resistance Thin films |
| Sumario: | We study the transport properties of C1-xCox thin films (with x = 0.1, 0.15 and 0.2) grown on Si substrate by pulsed laser deposition technique. The results demonstrate some anomalous effects in the behavior of the measured resistance R(T,x). More specifically, for 0 < T < T∗ range (with T∗ ≃ 220 K), the resistance is shown to be well fitted by a small polaron hopping scenario with Rh(T,x)∝exp(Formula presented.) and a characteristic temperature T0(x)≃T0(0)(1-x) (with T0(0) = 120 K). While for higher temperatures T∗ < T < TC(x), the resistance is found to be linearly dependent on spontaneous magnetization M(T,x), viz. RM(T,x)∝M(T,x), following the pattern dictated by electron scattering on cobalt atoms formed robust ferromagnetic structure with the Curie temperature TC(x) obeying a percolation like law TC(x)≃TC(xm)(x/xm)0.15 with TC(xm) = 295 K and the maximum zero-temperature magnetization reaching M(0,xm)≃0.5μB per Co atom for xm = 0.2. |
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