Atomic Force Microscopy: A Powerful Tool for Electrical Characterization
The fundamental principle of atomic force microscopy (AFM) is to obtain images of a surface by measuring deflections on a nanoscale probe. In its more than 25-year history, AFM has had its scope rapidly expanded to various scientific fields. Several techniques derived from this microscopy have appea...
| Autores: | , , , , |
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| Tipo de recurso: | capítulo de libro |
| Estado: | Versión publicada |
| Fecha de publicación: | 2017 |
| País: | Brasil |
| Institución: | Universidade Estadual Paulista (UNESP) |
| Repositorio: | Repositório Institucional da UNESP |
| Idioma: | inglés |
| OAI Identifier: | oai:repositorio.unesp.br:11449/232701 |
| Acceso en línea: | http://dx.doi.org/10.1016/B978-0-323-49778-7.00002-3 http://hdl.handle.net/11449/232701 |
| Access Level: | acceso abierto |
| Palabra clave: | Atomic force microscopy Electrostatic force microscopy (EFM) Intermittent contact Nanocharacterization Spatial resolution Topographical image |
| Sumario: | The fundamental principle of atomic force microscopy (AFM) is to obtain images of a surface by measuring deflections on a nanoscale probe. In its more than 25-year history, AFM has had its scope rapidly expanded to various scientific fields. Several techniques derived from this microscopy have appeared in recent years, providing additional information to the topographical images and enabling the investigation of chemical and physical properties of materials. This chapter will address the concepts and principles of AFM, as well as various aspects related to electrical nanocharacterization, using specific techniques such as electrostatic force microscopy (EFM) and scanning surface potential microscopy (SSPM). |
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