Multiscaling analysis of ferroelectric domain wall roughness
Using multiscaling analysis, we compare the characteristic roughening of ferroelectric domain walls in Pb(Zr0.2Ti0.8)O3 thin films with numerical simulations of weakly pinned one-dimensional interfaces. Although at length scales up to LMA ≥ 5 μm the ferroelectric domain walls behave similarly to the...
| Autores: | , , , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2012 |
| País: | Argentina |
| Institución: | Consejo Nacional de Investigaciones Científicas y Técnicas |
| Repositorio: | CONICET Digital (CONICET) |
| Idioma: | inglés |
| OAI Identifier: | oai:ri.conicet.gov.ar:11336/11241 |
| Acceso en línea: | http://hdl.handle.net/11336/11241 |
| Access Level: | acceso abierto |
| Palabra clave: | Ferroelectrics Domain Walls https://purl.org/becyt/ford/1.3 https://purl.org/becyt/ford/1 |
| Sumario: | Using multiscaling analysis, we compare the characteristic roughening of ferroelectric domain walls in Pb(Zr0.2Ti0.8)O3 thin films with numerical simulations of weakly pinned one-dimensional interfaces. Although at length scales up to LMA ≥ 5 μm the ferroelectric domain walls behave similarly to the numerical interfaces, showing a simple monoaffine scaling (with a well-defined roughness exponent ζ), we demonstrate more complex scaling at higher length scales, making the walls globally multiaffine (varying ζ at different observation length scales). The dominant contributions to this multiaffine scaling appear to be very localized variations in the disorder potential, possibly related to dislocation defects present in the substrate. |
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