Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles
Films of gmercap to propyltri methoxysilane are prepared by hydrolysis, condensation and curing at 80 oC. The optical indices, n, k and the thickness d are calculated using the ellipsometry technique.Aprogramme is developed to fit a wide set of ellipsometricï andï data in the visible optical region...
| Autores: | , , , , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2016 |
| País: | Argentina |
| Institución: | Consejo Nacional de Investigaciones Científicas y Técnicas |
| Repositorio: | CONICET Digital (CONICET) |
| Idioma: | inglés |
| OAI Identifier: | oai:ri.conicet.gov.ar:11336/49359 |
| Acceso en línea: | http://hdl.handle.net/11336/49359 |
| Access Level: | acceso abierto |
| Palabra clave: | SILANE ANTICORROSIVE ELLIPSOMETRY OPTICAL https://purl.org/becyt/ford/1.3 https://purl.org/becyt/ford/1 |
| Sumario: | Films of gmercap to propyltri methoxysilane are prepared by hydrolysis, condensation and curing at 80 oC. The optical indices, n, k and the thickness d are calculated using the ellipsometry technique.Aprogramme is developed to fit a wide set of ellipsometricï andï data in the visible optical region 400 nm < ë < 600 nm. An increase in the optical absorption k is detected for the lower concentration ofMPTMS attributed to light absorption from the pores. |
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