Significance of the high charge state of projectile ions inside the target and its role in electron capture leading to target-ionization phenomena
The K x-ray spectra of different targets (Cu, Zn, and Ge) induced by 3-5 MeV/u Si projectile ions have been measured to determine the K-shell ionization cross section. A significant difference is observed between the measurements and theoretical estimates, with the latter being about 50% below the e...
| Autores: | , , , , , , , |
|---|---|
| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2021 |
| País: | Argentina |
| Institución: | Consejo Nacional de Investigaciones Científicas y Técnicas |
| Repositorio: | CONICET Digital (CONICET) |
| Idioma: | inglés |
| OAI Identifier: | oai:ri.conicet.gov.ar:11336/211983 |
| Acceso en línea: | http://hdl.handle.net/11336/211983 |
| Access Level: | acceso abierto |
| Palabra clave: | CHARGE CAPTURE IONIZATION https://purl.org/becyt/ford/1.3 https://purl.org/becyt/ford/1 |
| Sumario: | The K x-ray spectra of different targets (Cu, Zn, and Ge) induced by 3-5 MeV/u Si projectile ions have been measured to determine the K-shell ionization cross section. A significant difference is observed between the measurements and theoretical estimates, with the latter being about 50% below the experimental results. This underestimation is attributed to the charge exchange from the target K shell to projectile K and L shells. Such an observation can only be possible if the projectile ions attain up to H- and He-like charge states. Corresponding projectile charge state fractions have been evaluated from the Lorentzian charge state distribution, where the mean charge state is taken from the Fermi gas model [W. Brandt, Phys. Rev. Lett. 30, 358 (1973)PRLTAO0031-900710.1103/PhysRevLett.30.358] and the width from the Novikov and Teplova approach [Phys. Lett. A 378, 1286 (2014)10.1016/j.physleta.2014.03.004]. The sum of the direct ionization cross section and K-K+K-L capture cross sections gives a good agreement with the measured cross sections. Furthermore, we have validated this methodology with available data for a Si ion on Ti target. Such results may be useful in many solid target-based applications. |
|---|