Semi-conductors faults analysis in dual active bridge DC-DC converter
Failures in power semi-conductors of a dual active bridge converter are characterised considering open-circuit faults in diodes and transistors. A detailed electrical waveforms analysis to identify the main symptoms of the converter during normal and failure conditions is presented. Based on this an...
| Autores: | , , , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2016 |
| País: | Argentina |
| Institución: | Consejo Nacional de Investigaciones Científicas y Técnicas |
| Repositorio: | CONICET Digital (CONICET) |
| Idioma: | inglés |
| OAI Identifier: | oai:ri.conicet.gov.ar:11336/75774 |
| Acceso en línea: | http://hdl.handle.net/11336/75774 |
| Access Level: | acceso abierto |
| Palabra clave: | Fault Diagnosis Bridge Circuits Dc-Dc Power Convertors https://purl.org/becyt/ford/2.2 https://purl.org/becyt/ford/2 |
| Sumario: | Failures in power semi-conductors of a dual active bridge converter are characterised considering open-circuit faults in diodes and transistors. A detailed electrical waveforms analysis to identify the main symptoms of the converter during normal and failure conditions is presented. Based on this analysis, a fault diagnosis strategy is proposed which is able to identify failures either in a diode or in a transistor as well as its location in the circuit. Finally, simulation and experimental results, using a prototype of 1 KW, are presented in this study to demonstrate the practical feasibility of the theoretical proposal. |
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