Modulated speckle simulations based on the random-walk model
The random walk model is employed to simulate modulated speckle patterns. We demonstrate that the geo metrical image approximation fails to describe the modulated speckle pattern. A new approach to analyzing this phenomenon is proposed. The validity of the approximations employed is verified by comp...
| Autores: | , , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2003 |
| País: | Argentina |
| Institución: | Universidad Nacional de La Plata |
| Repositorio: | SEDICI (UNLP) |
| Idioma: | inglés |
| OAI Identifier: | oai:sedici.unlp.edu.ar:10915/44355 |
| Acceso en línea: | http://sedici.unlp.edu.ar/handle/10915/44355 |
| Access Level: | acceso abierto |
| Palabra clave: | Ciencias Exactas Ingeniería óptica patrones de speckle modulados paseo aleatorio |
| Sumario: | The random walk model is employed to simulate modulated speckle patterns. We demonstrate that the geo metrical image approximation fails to describe the modulated speckle pattern. A new approach to analyzing this phenomenon is proposed. The validity of the approximations employed is verified by comparison of the simulation with the experimental results. Speckle metrological applications and phase measurement tech niques could be improved by taking advantage of this model. |
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