Study of silane layers grown on steel and characterized using ellipsometry at different wavelengths and incidence angles

Films of gmercap to propyltri methoxysilane are prepared by hydrolysis, condensation and curing at 80 oC. The optical indices, n, k and the thickness d are calculated using the ellipsometry technique.Aprogramme is developed to fit a wide set of ellipsometric and data in the visible optical region...

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Detalles Bibliográficos
Autores: Seré, Pablo Ricardo, Zerbino, Jorge Omar, Maltz, Alberto Leonardo, Elsner, Cecilia Inés, Di Sarli, Alejandro Ramón
Tipo de recurso: artículo
Estado:Versión publicada
Fecha de publicación:2016
País:Argentina
Institución:Universidad Nacional de La Plata
Repositorio:SEDICI (UNLP)
Idioma:inglés
OAI Identifier:oai:sedici.unlp.edu.ar:10915/81500
Acceso en línea:http://sedici.unlp.edu.ar/handle/10915/81500
Access Level:acceso abierto
Palabra clave:Ingeniería Química
Mercaptopropyltrimethoxysilane
Ellipsometry
Anticorrosive coating
Optical constants
Descripción
Sumario:Films of gmercap to propyltri methoxysilane are prepared by hydrolysis, condensation and curing at 80 oC. The optical indices, n, k and the thickness d are calculated using the ellipsometry technique.Aprogramme is developed to fit a wide set of ellipsometric and data in the visible optical region 400 nm < ë < 600 nm. An increase in the optical absorption k is detected for the lower concentration ofMPTMS attributed to light absorption from the pores.

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