Electronic properties of fluorosulfonyl isocyanate, FSO2NCO: A photoelectron spectroscopy and synchrotron photoionization study

The electronic properties of fluorosulfonyl isocyanate, FSO2NCO, were investigated by means of photoelectron spectroscopy and synchrotron based techniques. The first ionization potential occurs at 12.3 eV and was attributed to the ejection of electrons formally located at the π NCO molecular orbital...

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Detalhes bibliográficos
Autores: Moreno Betancourt, Angelica, Flores Antognini, Andrea, Erben, Mauricio Federico, Cavasso Filho, Reinaldo L., Tong, Shengrui, Ge, Maofa, Della Védova, Carlos Omar, Romano, Rosana Mariel
Tipo de documento: artigo
Estado:Versão publicada
Data de publicação:2013
País:Argentina
Recursos:Consejo Nacional de Investigaciones Científicas y Técnicas
Repositório:CONICET Digital (CONICET)
Idioma:inglês
OAI Identifier:oai:ri.conicet.gov.ar:11336/84143
Acesso em linha:http://hdl.handle.net/11336/84143
Access Level:Acceso aberto
Palavra-chave:Synchrotron Radiation
Isocyanates
Photoelectron Spectroscopy
Photoionization
https://purl.org/becyt/ford/1.4
https://purl.org/becyt/ford/1
Descrição
Resumo:The electronic properties of fluorosulfonyl isocyanate, FSO2NCO, were investigated by means of photoelectron spectroscopy and synchrotron based techniques. The first ionization potential occurs at 12.3 eV and was attributed to the ejection of electrons formally located at the π NCO molecular orbital (MO), with a contribution from nonbonding orbitals at the oxygen atoms of the SO2 group. The proposed interpretation of the photoelectron spectrum is consistent with related molecules reported previously and also with the prediction of OVGF (outer valence green function) and P3 (partial third order) calculations. The energy of the inner- and core-shell electrons was determined using X-ray absorption, measuring the total ion yield spectra, and the resonances before each ionization threshold were interpreted in terms of transitions to vacant molecular orbitals. The ionic fragmentation mechanisms in the valence energy region were studied using time-of-flight mass spectrometry as a function of the energy of the incident radiation. At 13 eV the M+ was the only ion detected in the photoion-photoelectron-coincidence spectrum, while the FSO2+ fragment, formed through the breaking of the S-N single bond, appears as the most intense fragment for energies higher than 15 eV. The photoion-photoion-photoelectron-coincidence spectra, taken at the inner- and core-levels energy regions, revealed several different fragmentation pathways, being the most important ones secondary decay after deferred charge separation mechanisms leading to the formation of the O +/S+ and C+/O+ pairs.