Effect of anodization on the surface characteristics and electrochemical behaviour of zirconium in artificial saliva
The paper is focused on elaboration of ZrO2 films on pure zirconium via anodizing inphosphoric acid with and without fluoride at constant potentials of 30 V and 60 V. Thestructure and composition of the films were investigated using scanning electronicmicroscopy, Raman spectroscopy and X-ray photoel...
| Autores: | , , , , |
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| Formato: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2016 |
| País: | Argentina |
| Recursos: | Consejo Nacional de Investigaciones Científicas y Técnicas |
| Repositorio: | CONICET Digital (CONICET) |
| Idioma: | inglés |
| OAI Identifier: | oai:ri.conicet.gov.ar:11336/32554 |
| Acesso em linha: | http://hdl.handle.net/11336/32554 |
| Access Level: | acceso abierto |
| Palavra-chave: | Anodized zirconium Fluoride XPS Corrosion resistance https://purl.org/becyt/ford/2.5 https://purl.org/becyt/ford/2 https://purl.org/becyt/ford/2.9 https://purl.org/becyt/ford/1.4 https://purl.org/becyt/ford/1 |
| Resumo: | The paper is focused on elaboration of ZrO2 films on pure zirconium via anodizing inphosphoric acid with and without fluoride at constant potentials of 30 V and 60 V. Thestructure and composition of the films were investigated using scanning electronicmicroscopy, Raman spectroscopy and X-ray photoelectron spectroscopy. The composition ofthe oxides formed at both potentials can be identified as monoclinic ZrO2. In addition to Zrand O, the layers formed in phosphoric acid contain phosphorus originating from thephosphoric acid. When the phosphoric acid solution contains NaF, fluorine is alsoincorporated into the oxide layer. The oxides formed at a higher voltage have greaterroughness than those formed at 30 V. Anodized samples exhibit smaller current densitiesduring anodic polarization compared to the as-received zirconium covered with native oxide. |
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