Corrigendum to "Effect of thickness on structural and electrical properties of Al-doped ZnO films"[Thin Solid Films] 574 (2015) 162-168
The authors apologize for some mistakes detected in the above-mentioned article. In the first place, the conductivity values of the vertical axis in Fig. 6 were wrong and, in fact, they differ from those mentioned in the discussion.
| Autores: | , , , |
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| Tipo de recurso: | artículo |
| Estado: | Versión publicada |
| Fecha de publicación: | 2015 |
| País: | Argentina |
| Institución: | Consejo Nacional de Investigaciones Científicas y Técnicas |
| Repositorio: | CONICET Digital (CONICET) |
| Idioma: | inglés |
| OAI Identifier: | oai:ri.conicet.gov.ar:11336/5977 |
| Acceso en línea: | http://hdl.handle.net/11336/5977 |
| Access Level: | acceso abierto |
| Palabra clave: | Zinc Oxide https://purl.org/becyt/ford/1.3 https://purl.org/becyt/ford/1 |
| Sumario: | The authors apologize for some mistakes detected in the above-mentioned article. In the first place, the conductivity values of the vertical axis in Fig. 6 were wrong and, in fact, they differ from those mentioned in the discussion. |
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