Díaz-Reyes, J., Galván-Arellano, M., & Peña-Sierra, R. (2010). Raman scattering and electrical characterization of AlGaAs/GaAs rectangular and triangular barriers grown by MOCVD.
Chicago Style CitationDíaz-Reyes, J., M. Galván-Arellano, and R. Peña-Sierra. Raman Scattering and Electrical Characterization of AlGaAs/GaAs Rectangular and Triangular Barriers Grown By MOCVD. 2010.
MLA CitationDíaz-Reyes, J., M. Galván-Arellano, and R. Peña-Sierra. Raman Scattering and Electrical Characterization of AlGaAs/GaAs Rectangular and Triangular Barriers Grown By MOCVD. 2010.
Warning: These citations may not always be 100% accurate.