Cita APA

González, O. V. H. (2019). Charge trapping dynamics associated to MOSFET degradation: An experimetal approach with magnetic fields.

Citación estilo Chicago

González, Oscar Vicente Huerta. Charge Trapping Dynamics Associated to MOSFET Degradation: An Experimetal Approach With Magnetic Fields. 2019.

Cita MLA

González, Oscar Vicente Huerta. Charge Trapping Dynamics Associated to MOSFET Degradation: An Experimetal Approach With Magnetic Fields. 2019.