Maldonado Mundo, D., & Luis Aina, A. (2009). Metrological resolution and minimum uncertainty states in linear and nonlinear signal detection schemes.
Citación estilo ChicagoMaldonado Mundo, Daniel, y Alfredo Luis Aina. Metrological Resolution and Minimum Uncertainty States in Linear and Nonlinear Signal Detection Schemes. 2009.
Cita MLAMaldonado Mundo, Daniel, y Alfredo Luis Aina. Metrological Resolution and Minimum Uncertainty States in Linear and Nonlinear Signal Detection Schemes. 2009.
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