Cita APA

Escobar-Galindo, R., Gago, R., Duday, D., & Palacio Orcajo, C. (2010). Towards nanometric resolution in multilayer depth profiling: A comparative study of RBS, SIMS, XPS and GDOES.

Citación estilo Chicago

Escobar-Galindo, Ramón, Raúl Gago, David Duday, y Carlos Palacio Orcajo. Towards Nanometric Resolution in Multilayer Depth Profiling: A Comparative Study of RBS, SIMS, XPS and GDOES. 2010.

Cita MLA

Escobar-Galindo, Ramón, Raúl Gago, David Duday, y Carlos Palacio Orcajo. Towards Nanometric Resolution in Multilayer Depth Profiling: A Comparative Study of RBS, SIMS, XPS and GDOES. 2010.