Balakrishnan, N., Castilla González, E. M., Martín Apaolaza, N., & Pardo Llorente, L. (2020). Robust inference for one‐shot device testing data under exponential lifetime model with multiple stresses.
Citación estilo ChicagoBalakrishnan, Narayanaswamy, Elena María Castilla González, Nirian Martín Apaolaza, y Leandro Pardo Llorente. Robust Inference for One‐shot Device Testing Data Under Exponential Lifetime Model With Multiple Stresses. 2020.
Cita MLABalakrishnan, Narayanaswamy, Elena María Castilla González, Nirian Martín Apaolaza, y Leandro Pardo Llorente. Robust Inference for One‐shot Device Testing Data Under Exponential Lifetime Model With Multiple Stresses. 2020.
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