Cita APA

Gao, Z., Romero, M., Pampillón Arce, M. Á., San Andrés Serrano, E., & Calle, F. (2015). Thermal stability study of AlGaN/GaN MOS-HEMTs using Gd2O3 as gate dielectric.

Citación estilo Chicago

Gao, Z., M.F Romero, María Ángela Pampillón Arce, Enrique San Andrés Serrano, y F. Calle. Thermal Stability Study of AlGaN/GaN MOS-HEMTs Using Gd2O3 As Gate Dielectric. 2015.

Cita MLA

Gao, Z., et al. Thermal Stability Study of AlGaN/GaN MOS-HEMTs Using Gd2O3 As Gate Dielectric. 2015.