Cita APA

Schierholz, R., Lacroix, B., Godinho, V., Caballero-Hernández, J., Duchamp, M., & Fernández-Camacho, A. (2015). STEM–EELS analysis reveals stable high-density He in nanopores of amorphous silicon coatings deposited by magnetron sputtering.

Citación estilo Chicago

Schierholz, R., Bertrand Lacroix, Vanda Godinho, J. Caballero-Hernández, Martial Duchamp, y A. Fernández-Camacho. STEM–EELS Analysis Reveals Stable High-density He in Nanopores of Amorphous Silicon Coatings Deposited By Magnetron Sputtering. 2015.

Cita MLA

Schierholz, R., et al. STEM–EELS Analysis Reveals Stable High-density He in Nanopores of Amorphous Silicon Coatings Deposited By Magnetron Sputtering. 2015.