Méndez Martín, M. B., Piqueras De Noriega, F. J., Domínguez-Adame Acosta, F., & De Diego, N. (1988). Spatial-distribution of defects in GaAs: Te wafers studied by cathodoluminescence.
Citación estilo ChicagoMéndez Martín, María Bianchi, Francisco Javier Piqueras De Noriega, Francisco Domínguez-Adame Acosta, y N. De Diego. Spatial-distribution of Defects in GaAs: Te Wafers Studied By Cathodoluminescence. 1988.
Cita MLAMéndez Martín, María Bianchi, Francisco Javier Piqueras De Noriega, Francisco Domínguez-Adame Acosta, y N. De Diego. Spatial-distribution of Defects in GaAs: Te Wafers Studied By Cathodoluminescence. 1988.
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