Cita APA

Carrillo Menéndez, S., & Hassani, B. K. (2021). Expected shortfall reliability—added value of traditional statistics and advanced artificial intelligence for market risk measurement purposes.

Citación estilo Chicago

Carrillo Menéndez, Santiago, y Bertrand Kian Hassani. Expected Shortfall Reliability—added Value of Traditional Statistics and Advanced Artificial Intelligence for Market Risk Measurement Purposes. 2021.

Cita MLA

Carrillo Menéndez, Santiago, y Bertrand Kian Hassani. Expected Shortfall Reliability—added Value of Traditional Statistics and Advanced Artificial Intelligence for Market Risk Measurement Purposes. 2021.