Cita APA

Otrokov, M. M., Rusinov, I. P., Blanco-Rey, M., Hoffmann, M., Vyazovskaya, A. Y., Eremeev, S. V., . . . Chulkov, E. V. (2019). Unique Thickness-Dependent Properties of the van der Waals Interlayer Antiferromagnet MnBi2Te4 Films.

Citación estilo Chicago

Otrokov, Mikhail M., et al. Unique Thickness-Dependent Properties of the Van Der Waals Interlayer Antiferromagnet MnBi2Te4 Films. 2019.

Cita MLA

Otrokov, Mikhail M., et al. Unique Thickness-Dependent Properties of the Van Der Waals Interlayer Antiferromagnet MnBi2Te4 Films. 2019.